Two-Terminal Nonvolatile Write-Once-Read-Many-Times Memory Based on All-Inorganic Halide Perovskite

Write-once-read-many-times (WORM) memory belonging to an important non-volatile memory type achieves the read-only state after the write operation and is used in the fields of data security storage widely. WORM memory has been developed based on a variety of materials. In recent years, halide perovskites have become the research hotspot material for this memory due to its excellent properties. Here, the all-inorganic CsPbBr(3) perovskite thin film was prepared on a FTO substrate by using a two-step method. The prepared CsPbBr(3) thin films have the characteristics of densely packed crystal grains and smooth surface. The device, having the FTO/CsPbBr(3)/Al sandwich structure by evaporating the Al electrode onto the CsPbBr(3) thin film, represents the typical WORM behavior, with long data retention time (10(4) s), a low operation voltage (2.1 V) and a low reading voltage (0.1 V). Additionally, the resistance transition mechanism of the resulting WORM devices was analyzed.