Cargando…
Extraction of Graphene’s RF Impedance through Thru-Reflect-Line Calibration
Graphene has unique properties that can be exploited for radiofrequency applications. Its characterization is key for the development of new graphene devices, circuits, and systems. Due to the two-dimensional nature of graphene, there are challenges in the methodology to extract relevant characteris...
Autores principales: | , , , , |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2023
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9865775/ https://www.ncbi.nlm.nih.gov/pubmed/36677276 http://dx.doi.org/10.3390/mi14010215 |
_version_ | 1784875922822791168 |
---|---|
author | Colmiais, Ivo Silva, Vitor Borme, Jérôme Alpuim, Pedro Mendes, Paulo M. |
author_facet | Colmiais, Ivo Silva, Vitor Borme, Jérôme Alpuim, Pedro Mendes, Paulo M. |
author_sort | Colmiais, Ivo |
collection | PubMed |
description | Graphene has unique properties that can be exploited for radiofrequency applications. Its characterization is key for the development of new graphene devices, circuits, and systems. Due to the two-dimensional nature of graphene, there are challenges in the methodology to extract relevant characteristics that are necessary for device design. In this work, the Thru-Reflect-Line (TRL) calibration was evaluated as a solution to extract graphene’s electrical characteristics from 1 GHz to 65 GHz, where the calibration structures’ requirements were analyzed. It was demonstrated that thick metallic contacts, a low-loss substrate, and a short and thin contact are necessary to characterize graphene. Furthermore, since graphene’s properties are dependent on the polarization voltage applied, a backgate has to be included so that graphene can be characterized for different chemical potentials. Such characterization is mandatory for the design of graphene RF electronics and can be used to extract characteristics such as graphene’s resistance, quantum capacitance, and kinetic inductance. Finally, the proposed structure was characterized, and graphene’s resistance and quantum capacitance were extracted. |
format | Online Article Text |
id | pubmed-9865775 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2023 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-98657752023-01-22 Extraction of Graphene’s RF Impedance through Thru-Reflect-Line Calibration Colmiais, Ivo Silva, Vitor Borme, Jérôme Alpuim, Pedro Mendes, Paulo M. Micromachines (Basel) Article Graphene has unique properties that can be exploited for radiofrequency applications. Its characterization is key for the development of new graphene devices, circuits, and systems. Due to the two-dimensional nature of graphene, there are challenges in the methodology to extract relevant characteristics that are necessary for device design. In this work, the Thru-Reflect-Line (TRL) calibration was evaluated as a solution to extract graphene’s electrical characteristics from 1 GHz to 65 GHz, where the calibration structures’ requirements were analyzed. It was demonstrated that thick metallic contacts, a low-loss substrate, and a short and thin contact are necessary to characterize graphene. Furthermore, since graphene’s properties are dependent on the polarization voltage applied, a backgate has to be included so that graphene can be characterized for different chemical potentials. Such characterization is mandatory for the design of graphene RF electronics and can be used to extract characteristics such as graphene’s resistance, quantum capacitance, and kinetic inductance. Finally, the proposed structure was characterized, and graphene’s resistance and quantum capacitance were extracted. MDPI 2023-01-14 /pmc/articles/PMC9865775/ /pubmed/36677276 http://dx.doi.org/10.3390/mi14010215 Text en © 2023 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Colmiais, Ivo Silva, Vitor Borme, Jérôme Alpuim, Pedro Mendes, Paulo M. Extraction of Graphene’s RF Impedance through Thru-Reflect-Line Calibration |
title | Extraction of Graphene’s RF Impedance through Thru-Reflect-Line Calibration |
title_full | Extraction of Graphene’s RF Impedance through Thru-Reflect-Line Calibration |
title_fullStr | Extraction of Graphene’s RF Impedance through Thru-Reflect-Line Calibration |
title_full_unstemmed | Extraction of Graphene’s RF Impedance through Thru-Reflect-Line Calibration |
title_short | Extraction of Graphene’s RF Impedance through Thru-Reflect-Line Calibration |
title_sort | extraction of graphene’s rf impedance through thru-reflect-line calibration |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9865775/ https://www.ncbi.nlm.nih.gov/pubmed/36677276 http://dx.doi.org/10.3390/mi14010215 |
work_keys_str_mv | AT colmiaisivo extractionofgraphenesrfimpedancethroughthrureflectlinecalibration AT silvavitor extractionofgraphenesrfimpedancethroughthrureflectlinecalibration AT bormejerome extractionofgraphenesrfimpedancethroughthrureflectlinecalibration AT alpuimpedro extractionofgraphenesrfimpedancethroughthrureflectlinecalibration AT mendespaulom extractionofgraphenesrfimpedancethroughthrureflectlinecalibration |