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Electrodeposition and analysis of thick bismuth films

Due to its unique physical and chemical properties, bismuth is an attractive candidate for a wide range of applications such as battery anodes, radiation shielding, and semiconductors, to name a few. This work presents the electrodeposition of mechanically stable and homogenous bismuth films at micr...

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Autores principales: Hatfield, Kendrich O., Dervishi, Enkeleda, Johnson, Don, Clark, Courtney, Brown, Nathan, Kidman, Genevieve C., Williams, Darrick J., Hooks, Daniel E.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9867696/
https://www.ncbi.nlm.nih.gov/pubmed/36681686
http://dx.doi.org/10.1038/s41598-023-28042-z
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author Hatfield, Kendrich O.
Dervishi, Enkeleda
Johnson, Don
Clark, Courtney
Brown, Nathan
Kidman, Genevieve C.
Williams, Darrick J.
Hooks, Daniel E.
author_facet Hatfield, Kendrich O.
Dervishi, Enkeleda
Johnson, Don
Clark, Courtney
Brown, Nathan
Kidman, Genevieve C.
Williams, Darrick J.
Hooks, Daniel E.
author_sort Hatfield, Kendrich O.
collection PubMed
description Due to its unique physical and chemical properties, bismuth is an attractive candidate for a wide range of applications such as battery anodes, radiation shielding, and semiconductors, to name a few. This work presents the electrodeposition of mechanically stable and homogenous bismuth films at micron-scale thicknesses. A simple one-step electrodeposition process using either a pulse/reverse or direct current source yielded thick, homogenous, and mechanically stable bismuth films. Morphology, electrochemical behavior, adhesion, and mechanical stability of bismuth coatings plated with varying parameters were characterized via optical profilometry, cyclic voltammetry, electron microscopy, and tribology. Scratch testing on thick electroplated coatings (> 100 µm) revealed similar wear resistance properties between the pulse/reverse plated and direct current electroplated films. This study presents a versatile bismuth electroplating process with the possibility to replace lead in radiation shields with an inexpensive, non-toxic metal, or to make industrially relevant electrocatalytic devices.
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spelling pubmed-98676962023-01-23 Electrodeposition and analysis of thick bismuth films Hatfield, Kendrich O. Dervishi, Enkeleda Johnson, Don Clark, Courtney Brown, Nathan Kidman, Genevieve C. Williams, Darrick J. Hooks, Daniel E. Sci Rep Article Due to its unique physical and chemical properties, bismuth is an attractive candidate for a wide range of applications such as battery anodes, radiation shielding, and semiconductors, to name a few. This work presents the electrodeposition of mechanically stable and homogenous bismuth films at micron-scale thicknesses. A simple one-step electrodeposition process using either a pulse/reverse or direct current source yielded thick, homogenous, and mechanically stable bismuth films. Morphology, electrochemical behavior, adhesion, and mechanical stability of bismuth coatings plated with varying parameters were characterized via optical profilometry, cyclic voltammetry, electron microscopy, and tribology. Scratch testing on thick electroplated coatings (> 100 µm) revealed similar wear resistance properties between the pulse/reverse plated and direct current electroplated films. This study presents a versatile bismuth electroplating process with the possibility to replace lead in radiation shields with an inexpensive, non-toxic metal, or to make industrially relevant electrocatalytic devices. Nature Publishing Group UK 2023-01-21 /pmc/articles/PMC9867696/ /pubmed/36681686 http://dx.doi.org/10.1038/s41598-023-28042-z Text en © The Author(s) 2023 https://creativecommons.org/licenses/by/4.0/Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. The images or other third party material in this article are included in the article's Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article's Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/ (https://creativecommons.org/licenses/by/4.0/) .
spellingShingle Article
Hatfield, Kendrich O.
Dervishi, Enkeleda
Johnson, Don
Clark, Courtney
Brown, Nathan
Kidman, Genevieve C.
Williams, Darrick J.
Hooks, Daniel E.
Electrodeposition and analysis of thick bismuth films
title Electrodeposition and analysis of thick bismuth films
title_full Electrodeposition and analysis of thick bismuth films
title_fullStr Electrodeposition and analysis of thick bismuth films
title_full_unstemmed Electrodeposition and analysis of thick bismuth films
title_short Electrodeposition and analysis of thick bismuth films
title_sort electrodeposition and analysis of thick bismuth films
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9867696/
https://www.ncbi.nlm.nih.gov/pubmed/36681686
http://dx.doi.org/10.1038/s41598-023-28042-z
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