Draft Genome Sequence of a Xylella fastidiosa Strain Causing Bacterial Leaf Scorch of American Elm in Washington, DC

Here, we report the draft genome sequence of Xylella fastidiosa strain ATCC 35873, which was obtained from the American Type Culture Collection and was originally isolated from a symptomatic American elm tree grown in Washington, DC. The ATCC 35873 genome contains 2,454,216 bp and has a GC content o...

Descripción completa

Detalles Bibliográficos
Autores principales: Guan, Wei, Shao, Jonathan, Zhao, Tingchang, Huang, Qi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Society for Microbiology 2022
Materias:
Genome Sequences
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9872675/
https://www.ncbi.nlm.nih.gov/pubmed/36448819
http://dx.doi.org/10.1128/mra.00831-22
_version_ 1784877452854558720
author Guan, Wei
Shao, Jonathan
Zhao, Tingchang
Huang, Qi
author_facet Guan, Wei
Shao, Jonathan
Zhao, Tingchang
Huang, Qi
author_sort Guan, Wei
collection PubMed
description Here, we report the draft genome sequence of Xylella fastidiosa strain ATCC 35873, which was obtained from the American Type Culture Collection and was originally isolated from a symptomatic American elm tree grown in Washington, DC. The ATCC 35873 genome contains 2,454,216 bp and has a GC content of 51.68%.
format Online
Article
Text
id pubmed-9872675
institution National Center for Biotechnology Information
language English
publishDate 2022
publisher American Society for Microbiology
record_format MEDLINE/PubMed
spelling pubmed-98726752023-01-25 Draft Genome Sequence of a Xylella fastidiosa Strain Causing Bacterial Leaf Scorch of American Elm in Washington, DC Guan, Wei Shao, Jonathan Zhao, Tingchang Huang, Qi Microbiol Resour Announc Genome Sequences Here, we report the draft genome sequence of Xylella fastidiosa strain ATCC 35873, which was obtained from the American Type Culture Collection and was originally isolated from a symptomatic American elm tree grown in Washington, DC. The ATCC 35873 genome contains 2,454,216 bp and has a GC content of 51.68%. American Society for Microbiology 2022-11-30 /pmc/articles/PMC9872675/ /pubmed/36448819 http://dx.doi.org/10.1128/mra.00831-22 Text en https://doi.org/10.1128/AuthorWarrantyLicense.v1This is a work of the U.S. Government and is not subject to copyright protection in the United States. Foreign copyrights may apply.
spellingShingle Genome Sequences
Guan, Wei
Shao, Jonathan
Zhao, Tingchang
Huang, Qi
Draft Genome Sequence of a Xylella fastidiosa Strain Causing Bacterial Leaf Scorch of American Elm in Washington, DC
title Draft Genome Sequence of a Xylella fastidiosa Strain Causing Bacterial Leaf Scorch of American Elm in Washington, DC
title_full Draft Genome Sequence of a Xylella fastidiosa Strain Causing Bacterial Leaf Scorch of American Elm in Washington, DC
title_fullStr Draft Genome Sequence of a Xylella fastidiosa Strain Causing Bacterial Leaf Scorch of American Elm in Washington, DC
title_full_unstemmed Draft Genome Sequence of a Xylella fastidiosa Strain Causing Bacterial Leaf Scorch of American Elm in Washington, DC
title_short Draft Genome Sequence of a Xylella fastidiosa Strain Causing Bacterial Leaf Scorch of American Elm in Washington, DC
title_sort draft genome sequence of a xylella fastidiosa strain causing bacterial leaf scorch of american elm in washington, dc
topic Genome Sequences
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9872675/
https://www.ncbi.nlm.nih.gov/pubmed/36448819
http://dx.doi.org/10.1128/mra.00831-22
work_keys_str_mv AT guanwei draftgenomesequenceofaxylellafastidiosastraincausingbacterialleafscorchofamericanelminwashingtondc
AT shaojonathan draftgenomesequenceofaxylellafastidiosastraincausingbacterialleafscorchofamericanelminwashingtondc
AT zhaotingchang draftgenomesequenceofaxylellafastidiosastraincausingbacterialleafscorchofamericanelminwashingtondc
AT huangqi draftgenomesequenceofaxylellafastidiosastraincausingbacterialleafscorchofamericanelminwashingtondc

Ejemplares similares