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Effect of field strength on RF power deposition near conductive leads: A simulation study of SAR in DBS lead models during MRI at 1.5 T—10.5 T
BACKGROUND: Since the advent of magnetic resonance imaging (MRI) nearly four decades ago, there has been a quest for ever-higher magnetic field strengths. Strong incentives exist to do so, as increasing the magnetic field strength increases the signal-to-noise ratio of images. However, ensuring pati...
Autores principales: | , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Public Library of Science
2023
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9879463/ https://www.ncbi.nlm.nih.gov/pubmed/36701285 http://dx.doi.org/10.1371/journal.pone.0280655 |
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author | Kazemivalipour, Ehsan Sadeghi-Tarakameh, Alireza Keil, Boris Eryaman, Yigitcan Atalar, Ergin Golestanirad, Laleh |
author_facet | Kazemivalipour, Ehsan Sadeghi-Tarakameh, Alireza Keil, Boris Eryaman, Yigitcan Atalar, Ergin Golestanirad, Laleh |
author_sort | Kazemivalipour, Ehsan |
collection | PubMed |
description | BACKGROUND: Since the advent of magnetic resonance imaging (MRI) nearly four decades ago, there has been a quest for ever-higher magnetic field strengths. Strong incentives exist to do so, as increasing the magnetic field strength increases the signal-to-noise ratio of images. However, ensuring patient safety becomes more challenging at high and ultrahigh field MRI (i.e., ≥3 T) compared to lower fields. The problem is exacerbated for patients with conductive implants, such as those with deep brain stimulation (DBS) devices, as excessive local heating can occur around implanted lead tips. Despite extensive effort to assess radio frequency (RF) heating of implants during MRI at 1.5 T, a comparative study that systematically examines the effects of field strength and various exposure limits on RF heating is missing. PURPOSE: This study aims to perform numerical simulations that systematically compare RF power deposition near DBS lead models during MRI at common clinical and ultra-high field strengths, namely 1.5, 3, 7, and 10.5 T. Furthermore, we assess the effects of different exposure constraints on RF power deposition by imposing limits on either the B(1)(+) or global head specific absorption rate (SAR) as these two exposure limits commonly appear in MRI guidelines. METHODS: We created 33 unique DBS lead models based on postoperative computed tomography (CT) images of patients with implanted DBS devices and performed electromagnetic simulations to evaluate the SAR of RF energy in the tissue surrounding lead tips during RF exposure at frequencies ranging from 64 MHz (1.5 T) to 447 MHz (10.5 T). The RF exposure was implemented via realistic MRI RF coil models created based on physical prototypes built in our institutions. We systematically examined the distribution of local SAR at different frequencies with the input coil power adjusted to either limit the B(1)(+) or the global head SAR. RESULTS: The MRI RF coils at higher resonant frequencies generated lower SARs around the lead tips when the global head SAR was constrained. The trend was reversed when the constraint was imposed on B(1)(+). CONCLUSION: At higher static fields, MRI is not necessarily more dangerous than at lower fields for patients with conductive leads. Specifically, when a conservative safety criterion, such as constraints on the global SAR, is imposed, coils at a higher resonant frequency tend to generate a lower local SAR around implanted leads due to the decreased B(1)(+) and, by proxy, E field levels. |
format | Online Article Text |
id | pubmed-9879463 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2023 |
publisher | Public Library of Science |
record_format | MEDLINE/PubMed |
spelling | pubmed-98794632023-01-27 Effect of field strength on RF power deposition near conductive leads: A simulation study of SAR in DBS lead models during MRI at 1.5 T—10.5 T Kazemivalipour, Ehsan Sadeghi-Tarakameh, Alireza Keil, Boris Eryaman, Yigitcan Atalar, Ergin Golestanirad, Laleh PLoS One Research Article BACKGROUND: Since the advent of magnetic resonance imaging (MRI) nearly four decades ago, there has been a quest for ever-higher magnetic field strengths. Strong incentives exist to do so, as increasing the magnetic field strength increases the signal-to-noise ratio of images. However, ensuring patient safety becomes more challenging at high and ultrahigh field MRI (i.e., ≥3 T) compared to lower fields. The problem is exacerbated for patients with conductive implants, such as those with deep brain stimulation (DBS) devices, as excessive local heating can occur around implanted lead tips. Despite extensive effort to assess radio frequency (RF) heating of implants during MRI at 1.5 T, a comparative study that systematically examines the effects of field strength and various exposure limits on RF heating is missing. PURPOSE: This study aims to perform numerical simulations that systematically compare RF power deposition near DBS lead models during MRI at common clinical and ultra-high field strengths, namely 1.5, 3, 7, and 10.5 T. Furthermore, we assess the effects of different exposure constraints on RF power deposition by imposing limits on either the B(1)(+) or global head specific absorption rate (SAR) as these two exposure limits commonly appear in MRI guidelines. METHODS: We created 33 unique DBS lead models based on postoperative computed tomography (CT) images of patients with implanted DBS devices and performed electromagnetic simulations to evaluate the SAR of RF energy in the tissue surrounding lead tips during RF exposure at frequencies ranging from 64 MHz (1.5 T) to 447 MHz (10.5 T). The RF exposure was implemented via realistic MRI RF coil models created based on physical prototypes built in our institutions. We systematically examined the distribution of local SAR at different frequencies with the input coil power adjusted to either limit the B(1)(+) or the global head SAR. RESULTS: The MRI RF coils at higher resonant frequencies generated lower SARs around the lead tips when the global head SAR was constrained. The trend was reversed when the constraint was imposed on B(1)(+). CONCLUSION: At higher static fields, MRI is not necessarily more dangerous than at lower fields for patients with conductive leads. Specifically, when a conservative safety criterion, such as constraints on the global SAR, is imposed, coils at a higher resonant frequency tend to generate a lower local SAR around implanted leads due to the decreased B(1)(+) and, by proxy, E field levels. Public Library of Science 2023-01-26 /pmc/articles/PMC9879463/ /pubmed/36701285 http://dx.doi.org/10.1371/journal.pone.0280655 Text en © 2023 Kazemivalipour et al https://creativecommons.org/licenses/by/4.0/This is an open access article distributed under the terms of the Creative Commons Attribution License (https://creativecommons.org/licenses/by/4.0/) , which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited. |
spellingShingle | Research Article Kazemivalipour, Ehsan Sadeghi-Tarakameh, Alireza Keil, Boris Eryaman, Yigitcan Atalar, Ergin Golestanirad, Laleh Effect of field strength on RF power deposition near conductive leads: A simulation study of SAR in DBS lead models during MRI at 1.5 T—10.5 T |
title | Effect of field strength on RF power deposition near conductive leads: A simulation study of SAR in DBS lead models during MRI at 1.5 T—10.5 T |
title_full | Effect of field strength on RF power deposition near conductive leads: A simulation study of SAR in DBS lead models during MRI at 1.5 T—10.5 T |
title_fullStr | Effect of field strength on RF power deposition near conductive leads: A simulation study of SAR in DBS lead models during MRI at 1.5 T—10.5 T |
title_full_unstemmed | Effect of field strength on RF power deposition near conductive leads: A simulation study of SAR in DBS lead models during MRI at 1.5 T—10.5 T |
title_short | Effect of field strength on RF power deposition near conductive leads: A simulation study of SAR in DBS lead models during MRI at 1.5 T—10.5 T |
title_sort | effect of field strength on rf power deposition near conductive leads: a simulation study of sar in dbs lead models during mri at 1.5 t—10.5 t |
topic | Research Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9879463/ https://www.ncbi.nlm.nih.gov/pubmed/36701285 http://dx.doi.org/10.1371/journal.pone.0280655 |
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