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CT-based data generation for foreign object detection on a single X-ray projection
Although X-ray imaging is used routinely in industry for high-throughput product quality control, its capability to detect internal defects has strong limitations. The main challenge stems from the superposition of multiple object features within a single X-ray view. Deep Convolutional neural networ...
Autores principales: | Andriiashen, Vladyslav, van Liere, Robert, van Leeuwen, Tristan, Batenburg, K. Joost |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2023
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9894971/ https://www.ncbi.nlm.nih.gov/pubmed/36732337 http://dx.doi.org/10.1038/s41598-023-29079-w |
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