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Detection of False Data Injection Attacks in Smart Grids Based on Expectation Maximization

The secure operation of smart grids is closely linked to state estimates that accurately reflect the physical characteristics of the grid. However, well-designed false data injection attacks (FDIAs) can manipulate the process of state estimation by injecting malicious data into the measurement data...

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Autores principales: Hu, Pengfei, Gao, Wengen, Li, Yunfei, Wu, Minghui, Hua, Feng, Qiao, Lina
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9919858/
https://www.ncbi.nlm.nih.gov/pubmed/36772723
http://dx.doi.org/10.3390/s23031683
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author Hu, Pengfei
Gao, Wengen
Li, Yunfei
Wu, Minghui
Hua, Feng
Qiao, Lina
author_facet Hu, Pengfei
Gao, Wengen
Li, Yunfei
Wu, Minghui
Hua, Feng
Qiao, Lina
author_sort Hu, Pengfei
collection PubMed
description The secure operation of smart grids is closely linked to state estimates that accurately reflect the physical characteristics of the grid. However, well-designed false data injection attacks (FDIAs) can manipulate the process of state estimation by injecting malicious data into the measurement data while bypassing the detection of the security system, ultimately causing the results of state estimation to deviate from secure values. Since FDIAs tampering with the measurement data of some buses will lead to error offset, this paper proposes an attack-detection algorithm based on statistical learning according to the different characteristic parameters of measurement error before and after tampering. In order to detect and classify false data from the measurement data, in this paper, we report the model establishment and estimation of error parameters for the tampered measurement data by combining the the k-means++ algorithm with the expectation maximization (EM) algorithm. At the same time, we located and recorded the bus that the attacker attempted to tamper with. In order to verify the feasibility of the algorithm proposed in this paper, the IEEE 5-bus standard test system and the IEEE 14-bus standard test system were used for simulation analysis. Numerical examples demonstrate that the combined use of the two algorithms can decrease the detection time to less than 0.011883 s and correctly locate the false data with a probability of more than 95%.
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spelling pubmed-99198582023-02-12 Detection of False Data Injection Attacks in Smart Grids Based on Expectation Maximization Hu, Pengfei Gao, Wengen Li, Yunfei Wu, Minghui Hua, Feng Qiao, Lina Sensors (Basel) Article The secure operation of smart grids is closely linked to state estimates that accurately reflect the physical characteristics of the grid. However, well-designed false data injection attacks (FDIAs) can manipulate the process of state estimation by injecting malicious data into the measurement data while bypassing the detection of the security system, ultimately causing the results of state estimation to deviate from secure values. Since FDIAs tampering with the measurement data of some buses will lead to error offset, this paper proposes an attack-detection algorithm based on statistical learning according to the different characteristic parameters of measurement error before and after tampering. In order to detect and classify false data from the measurement data, in this paper, we report the model establishment and estimation of error parameters for the tampered measurement data by combining the the k-means++ algorithm with the expectation maximization (EM) algorithm. At the same time, we located and recorded the bus that the attacker attempted to tamper with. In order to verify the feasibility of the algorithm proposed in this paper, the IEEE 5-bus standard test system and the IEEE 14-bus standard test system were used for simulation analysis. Numerical examples demonstrate that the combined use of the two algorithms can decrease the detection time to less than 0.011883 s and correctly locate the false data with a probability of more than 95%. MDPI 2023-02-03 /pmc/articles/PMC9919858/ /pubmed/36772723 http://dx.doi.org/10.3390/s23031683 Text en © 2023 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Hu, Pengfei
Gao, Wengen
Li, Yunfei
Wu, Minghui
Hua, Feng
Qiao, Lina
Detection of False Data Injection Attacks in Smart Grids Based on Expectation Maximization
title Detection of False Data Injection Attacks in Smart Grids Based on Expectation Maximization
title_full Detection of False Data Injection Attacks in Smart Grids Based on Expectation Maximization
title_fullStr Detection of False Data Injection Attacks in Smart Grids Based on Expectation Maximization
title_full_unstemmed Detection of False Data Injection Attacks in Smart Grids Based on Expectation Maximization
title_short Detection of False Data Injection Attacks in Smart Grids Based on Expectation Maximization
title_sort detection of false data injection attacks in smart grids based on expectation maximization
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9919858/
https://www.ncbi.nlm.nih.gov/pubmed/36772723
http://dx.doi.org/10.3390/s23031683
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