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Interpretation of Reflection and Colorimetry Characteristics of Indium-Particle Films by Means of Ellipsometric Modeling

It is of great technological importance in the field of plasmonic color generation to establish and understand the relationship between optical responses and the reflectance of metallic nanoparticles. Previously, a series of indium nanoparticle ensembles were fabricated using electron beam evaporati...

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Autores principales: Zhang, Hao-Tian, He, Rong, Peng, Lei, Yang, Yu-Ting, Sun, Xiao-Jie, Zhang, Yu-Shan, Zheng, Yu-Xiang, Liu, Bao-Jian, Zhang, Rong-Jun, Wang, Song-You, Li, Jing, Lee, Young-Pak, Chen, Liang-Yao
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9920837/
https://www.ncbi.nlm.nih.gov/pubmed/36770343
http://dx.doi.org/10.3390/nano13030383
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author Zhang, Hao-Tian
He, Rong
Peng, Lei
Yang, Yu-Ting
Sun, Xiao-Jie
Zhang, Yu-Shan
Zheng, Yu-Xiang
Liu, Bao-Jian
Zhang, Rong-Jun
Wang, Song-You
Li, Jing
Lee, Young-Pak
Chen, Liang-Yao
author_facet Zhang, Hao-Tian
He, Rong
Peng, Lei
Yang, Yu-Ting
Sun, Xiao-Jie
Zhang, Yu-Shan
Zheng, Yu-Xiang
Liu, Bao-Jian
Zhang, Rong-Jun
Wang, Song-You
Li, Jing
Lee, Young-Pak
Chen, Liang-Yao
author_sort Zhang, Hao-Tian
collection PubMed
description It is of great technological importance in the field of plasmonic color generation to establish and understand the relationship between optical responses and the reflectance of metallic nanoparticles. Previously, a series of indium nanoparticle ensembles were fabricated using electron beam evaporation and inspected using spectroscopic ellipsometry (SE). The multi-oscillator Lorentz–Drude model demonstrated the optical responses of indium nanoparticles with different sizes and size distributions. The reflectance spectra and colorimetry characteristics of indium nanoparticles with unimodal and bimodal size distributions were interpreted based on the SE analysis. The trends of reflectance spectra were explained by the transfer matrix method. The effects of optical constants n and k of indium on the reflectance were demonstrated by mapping the reflectance contour lines on the n-k plane. Using oscillator decomposition, the influence of different electron behaviors in various indium structures on the reflectance spectra was revealed intuitively. The contribution of each oscillator on the colorimetry characteristics, including hue, lightness and saturation, were determined and discussed from the reflectance spectral analysis.
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spelling pubmed-99208372023-02-12 Interpretation of Reflection and Colorimetry Characteristics of Indium-Particle Films by Means of Ellipsometric Modeling Zhang, Hao-Tian He, Rong Peng, Lei Yang, Yu-Ting Sun, Xiao-Jie Zhang, Yu-Shan Zheng, Yu-Xiang Liu, Bao-Jian Zhang, Rong-Jun Wang, Song-You Li, Jing Lee, Young-Pak Chen, Liang-Yao Nanomaterials (Basel) Article It is of great technological importance in the field of plasmonic color generation to establish and understand the relationship between optical responses and the reflectance of metallic nanoparticles. Previously, a series of indium nanoparticle ensembles were fabricated using electron beam evaporation and inspected using spectroscopic ellipsometry (SE). The multi-oscillator Lorentz–Drude model demonstrated the optical responses of indium nanoparticles with different sizes and size distributions. The reflectance spectra and colorimetry characteristics of indium nanoparticles with unimodal and bimodal size distributions were interpreted based on the SE analysis. The trends of reflectance spectra were explained by the transfer matrix method. The effects of optical constants n and k of indium on the reflectance were demonstrated by mapping the reflectance contour lines on the n-k plane. Using oscillator decomposition, the influence of different electron behaviors in various indium structures on the reflectance spectra was revealed intuitively. The contribution of each oscillator on the colorimetry characteristics, including hue, lightness and saturation, were determined and discussed from the reflectance spectral analysis. MDPI 2023-01-18 /pmc/articles/PMC9920837/ /pubmed/36770343 http://dx.doi.org/10.3390/nano13030383 Text en © 2023 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Zhang, Hao-Tian
He, Rong
Peng, Lei
Yang, Yu-Ting
Sun, Xiao-Jie
Zhang, Yu-Shan
Zheng, Yu-Xiang
Liu, Bao-Jian
Zhang, Rong-Jun
Wang, Song-You
Li, Jing
Lee, Young-Pak
Chen, Liang-Yao
Interpretation of Reflection and Colorimetry Characteristics of Indium-Particle Films by Means of Ellipsometric Modeling
title Interpretation of Reflection and Colorimetry Characteristics of Indium-Particle Films by Means of Ellipsometric Modeling
title_full Interpretation of Reflection and Colorimetry Characteristics of Indium-Particle Films by Means of Ellipsometric Modeling
title_fullStr Interpretation of Reflection and Colorimetry Characteristics of Indium-Particle Films by Means of Ellipsometric Modeling
title_full_unstemmed Interpretation of Reflection and Colorimetry Characteristics of Indium-Particle Films by Means of Ellipsometric Modeling
title_short Interpretation of Reflection and Colorimetry Characteristics of Indium-Particle Films by Means of Ellipsometric Modeling
title_sort interpretation of reflection and colorimetry characteristics of indium-particle films by means of ellipsometric modeling
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9920837/
https://www.ncbi.nlm.nih.gov/pubmed/36770343
http://dx.doi.org/10.3390/nano13030383
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