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Open-circuit and short-circuit loss management in wide-gap perovskite p-i-n solar cells

In this work, we couple theoretical and experimental approaches to understand and reduce the losses of wide bandgap Br-rich perovskite pin devices at open-circuit voltage (V(OC)) and short-circuit current (J(SC)) conditions. A mismatch between the internal quasi-Fermi level splitting (QFLS) and the...

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Detalles Bibliográficos
Autores principales: Caprioglio, Pietro, Smith, Joel A., Oliver, Robert D. J., Dasgupta, Akash, Choudhary, Saqlain, Farrar, Michael D., Ramadan, Alexandra J., Lin, Yen-Hung, Christoforo, M. Greyson, Ball, James M., Diekmann, Jonas, Thiesbrummel, Jarla, Zaininger, Karl-Augustin, Shen, Xinyi, Johnston, Michael B., Neher, Dieter, Stolterfoht, Martin, Snaith, Henry J.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9941504/
https://www.ncbi.nlm.nih.gov/pubmed/36805448
http://dx.doi.org/10.1038/s41467-023-36141-8
Descripción
Sumario:In this work, we couple theoretical and experimental approaches to understand and reduce the losses of wide bandgap Br-rich perovskite pin devices at open-circuit voltage (V(OC)) and short-circuit current (J(SC)) conditions. A mismatch between the internal quasi-Fermi level splitting (QFLS) and the external V(OC) is detrimental for these devices. We demonstrate that modifying the perovskite top-surface with guanidinium-Br and imidazolium-Br forms a low-dimensional perovskite phase at the n-interface, suppressing the QFLS-V(OC) mismatch, and boosting the V(OC). Concurrently, the use of an ionic interlayer or a self-assembled monolayer at the p-interface reduces the inferred field screening induced by mobile ions at J(SC), promoting charge extraction and raising the J(SC). The combination of the n- and p-type optimizations allows us to approach the thermodynamic potential of the perovskite absorber layer, resulting in 1 cm(2) devices with performance parameters of V(OC)s up to 1.29 V, fill factors above 80% and J(SC)s up to 17 mA/cm(2), in addition to a thermal stability T(80) lifetime of more than 3500 h at 85 °C.