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Hardware-in-the-Loop Test Bench for Simulation of Catenary–Pantograph Interaction (CPI) with Linear Camera Measurement
Catenary–pantograph contact force is generally used for assessment of the current collection quality. A good current collection quality not only increases catenary lifetime but also keeps a stable electric supply and helps to avoid accidents. Low contact forces lead to electric arcs that degrade the...
Autores principales: | , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2023
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9958849/ https://www.ncbi.nlm.nih.gov/pubmed/36850369 http://dx.doi.org/10.3390/s23041773 |
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author | Correcher, Antonio Ricolfe-Viala, Carlos Tur, Manuel Gregori, Santiago Salvador-Muñoz, Mario Fuenmayor, F. Javier Gil, Jaime Pedrosa, Ana M. |
author_facet | Correcher, Antonio Ricolfe-Viala, Carlos Tur, Manuel Gregori, Santiago Salvador-Muñoz, Mario Fuenmayor, F. Javier Gil, Jaime Pedrosa, Ana M. |
author_sort | Correcher, Antonio |
collection | PubMed |
description | Catenary–pantograph contact force is generally used for assessment of the current collection quality. A good current collection quality not only increases catenary lifetime but also keeps a stable electric supply and helps to avoid accidents. Low contact forces lead to electric arcs that degrade the catenary, and high contact forces generate excessive wear on the sliding surfaces. Railway track operators require track tests to ensure that catenary–pantograph force remains between safe values. However, a direct measure of the contact force requires an instrumented pantograph which is generally costly and complicated. This paper presents a test bench that allows testing virtual catenaries over real pantographs. Therefore, the contact point force behavior can be tested before the track test to guarantee that the test is passed. Moreover, due to its flexibility, the system can be used for model identification and validation, catenary testing, or contact loss simulation. The test bench also explores using computer vision as an additional sensor for each application. Results show that the system has high precision and flexibility in the available tests. |
format | Online Article Text |
id | pubmed-9958849 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2023 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-99588492023-02-26 Hardware-in-the-Loop Test Bench for Simulation of Catenary–Pantograph Interaction (CPI) with Linear Camera Measurement Correcher, Antonio Ricolfe-Viala, Carlos Tur, Manuel Gregori, Santiago Salvador-Muñoz, Mario Fuenmayor, F. Javier Gil, Jaime Pedrosa, Ana M. Sensors (Basel) Article Catenary–pantograph contact force is generally used for assessment of the current collection quality. A good current collection quality not only increases catenary lifetime but also keeps a stable electric supply and helps to avoid accidents. Low contact forces lead to electric arcs that degrade the catenary, and high contact forces generate excessive wear on the sliding surfaces. Railway track operators require track tests to ensure that catenary–pantograph force remains between safe values. However, a direct measure of the contact force requires an instrumented pantograph which is generally costly and complicated. This paper presents a test bench that allows testing virtual catenaries over real pantographs. Therefore, the contact point force behavior can be tested before the track test to guarantee that the test is passed. Moreover, due to its flexibility, the system can be used for model identification and validation, catenary testing, or contact loss simulation. The test bench also explores using computer vision as an additional sensor for each application. Results show that the system has high precision and flexibility in the available tests. MDPI 2023-02-04 /pmc/articles/PMC9958849/ /pubmed/36850369 http://dx.doi.org/10.3390/s23041773 Text en © 2023 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Correcher, Antonio Ricolfe-Viala, Carlos Tur, Manuel Gregori, Santiago Salvador-Muñoz, Mario Fuenmayor, F. Javier Gil, Jaime Pedrosa, Ana M. Hardware-in-the-Loop Test Bench for Simulation of Catenary–Pantograph Interaction (CPI) with Linear Camera Measurement |
title | Hardware-in-the-Loop Test Bench for Simulation of Catenary–Pantograph Interaction (CPI) with Linear Camera Measurement |
title_full | Hardware-in-the-Loop Test Bench for Simulation of Catenary–Pantograph Interaction (CPI) with Linear Camera Measurement |
title_fullStr | Hardware-in-the-Loop Test Bench for Simulation of Catenary–Pantograph Interaction (CPI) with Linear Camera Measurement |
title_full_unstemmed | Hardware-in-the-Loop Test Bench for Simulation of Catenary–Pantograph Interaction (CPI) with Linear Camera Measurement |
title_short | Hardware-in-the-Loop Test Bench for Simulation of Catenary–Pantograph Interaction (CPI) with Linear Camera Measurement |
title_sort | hardware-in-the-loop test bench for simulation of catenary–pantograph interaction (cpi) with linear camera measurement |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9958849/ https://www.ncbi.nlm.nih.gov/pubmed/36850369 http://dx.doi.org/10.3390/s23041773 |
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