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Angle Kappa agreement between Scheimpflug tomography, combined placido Scheimpflug and combined slit scanning placido systems
PURPOSE: To compare the measured or calculated angle Kappa using Oculus pentacam HR, Sirius and Orbscan III devices. PATIENTS AND METHODS: A prospective randomized cohort study, conducted on 47 eyes of 47 healthy orthotropic individuals, with an age range of 18–50 years and a corrected Snellen’s dis...
Autores principales: | , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Springer Netherlands
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9971106/ https://www.ncbi.nlm.nih.gov/pubmed/35902424 http://dx.doi.org/10.1007/s10792-022-02433-z |
Sumario: | PURPOSE: To compare the measured or calculated angle Kappa using Oculus pentacam HR, Sirius and Orbscan III devices. PATIENTS AND METHODS: A prospective randomized cohort study, conducted on 47 eyes of 47 healthy orthotropic individuals, with an age range of 18–50 years and a corrected Snellen’s distance visual acuity (CDVA) of 0.8 decimal or better. Angle Kappa is assessed directly using Orbscan® III software version 1.8.165.1. (Bausch and Lomb Rochester, New York, United States), while Pentacam® HR 1.21r.65 (Oculus Optikgeräte GmbH, Wetzlar, Germany) and Sirius device (CSO, version 3.2.1.60, Costruzione Strumenti Oftalmici, Florence, Italy) were used to calculate angle kappa indirectly. RESULTS: Least mean difference of estimated angle Kappa was between Orbscan and Pentacam devices (− 0.18° ± 1.8), and it was statistically insignificant (p value = 0.1294). Differences between both Orbscan and Sirius, and Pentacam and Sirius were statistically significant (p value = 0.0004 and < 0.0001 consecutively). Bland Altman analysis showed a 95% confidence interval between Orbscan III and Pentacam of − 3.76 to 3.4 and between Orbscan III and Sirius of − 3.79 to 2.26. CONCLUSION: Pentacam parameters can be used as a reliable method to calculate angle kappa indirectly, without usage of any additional measurements from other machine. Sirius device parameters could also be used, but with less accurate results. A simple modification to those devices’ software to calculate it, and incorporate it in the printout is possible, and highly recommended. |
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