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A scalable thin-film defect quantify model under imbalanced regression and classification task based on computer vision

Optical coating damage detection is a part of both industrial production and scientific research. Traditional methods require sophisticated expert systems or experienced front-line producers, and the cost of these methods rises dramatically when film types or inspection environments change. In pract...

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Detalles Bibliográficos
Autores principales: Yang, Guoliang, Zhou, Gaohao, Wang, Changyuan, Mu, Jing, Yang, Zhenhu, Li, Yuan, Su, Junhong
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9971186/
https://www.ncbi.nlm.nih.gov/pubmed/36865455
http://dx.doi.org/10.1016/j.heliyon.2023.e13701
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author Yang, Guoliang
Zhou, Gaohao
Wang, Changyuan
Mu, Jing
Yang, Zhenhu
Li, Yuan
Su, Junhong
author_facet Yang, Guoliang
Zhou, Gaohao
Wang, Changyuan
Mu, Jing
Yang, Zhenhu
Li, Yuan
Su, Junhong
author_sort Yang, Guoliang
collection PubMed
description Optical coating damage detection is a part of both industrial production and scientific research. Traditional methods require sophisticated expert systems or experienced front-line producers, and the cost of these methods rises dramatically when film types or inspection environments change. In practice, it has been found that customized expert systems imply a significant investment of time and money, and we expect to find a method that can perform this task automatically and quickly, while at the same time the method should be adaptable to the later addition of coating types and the ability to identify damage kinds. In this paper, we propose a deep neural network-based detection tool that splits the task into two parts: damage classification and damage degree regression. Introduces attention mechanisms and Embedding operations to enhance the performance of the model. It was found that the damage type detection accuracy of our model reached 93.65%, and the regression loss was kept within 10% on different data sets. We believe that deep neural networks have great potential to tackle industrial defect detection by significantly reducing the design cost and time of traditional expert systems, while gaining the ability to detect entirely new damage types at a fraction of the cost.
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spelling pubmed-99711862023-03-01 A scalable thin-film defect quantify model under imbalanced regression and classification task based on computer vision Yang, Guoliang Zhou, Gaohao Wang, Changyuan Mu, Jing Yang, Zhenhu Li, Yuan Su, Junhong Heliyon Review Article Optical coating damage detection is a part of both industrial production and scientific research. Traditional methods require sophisticated expert systems or experienced front-line producers, and the cost of these methods rises dramatically when film types or inspection environments change. In practice, it has been found that customized expert systems imply a significant investment of time and money, and we expect to find a method that can perform this task automatically and quickly, while at the same time the method should be adaptable to the later addition of coating types and the ability to identify damage kinds. In this paper, we propose a deep neural network-based detection tool that splits the task into two parts: damage classification and damage degree regression. Introduces attention mechanisms and Embedding operations to enhance the performance of the model. It was found that the damage type detection accuracy of our model reached 93.65%, and the regression loss was kept within 10% on different data sets. We believe that deep neural networks have great potential to tackle industrial defect detection by significantly reducing the design cost and time of traditional expert systems, while gaining the ability to detect entirely new damage types at a fraction of the cost. Elsevier 2023-02-11 /pmc/articles/PMC9971186/ /pubmed/36865455 http://dx.doi.org/10.1016/j.heliyon.2023.e13701 Text en © 2023 The Authors https://creativecommons.org/licenses/by-nc-nd/4.0/This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/).
spellingShingle Review Article
Yang, Guoliang
Zhou, Gaohao
Wang, Changyuan
Mu, Jing
Yang, Zhenhu
Li, Yuan
Su, Junhong
A scalable thin-film defect quantify model under imbalanced regression and classification task based on computer vision
title A scalable thin-film defect quantify model under imbalanced regression and classification task based on computer vision
title_full A scalable thin-film defect quantify model under imbalanced regression and classification task based on computer vision
title_fullStr A scalable thin-film defect quantify model under imbalanced regression and classification task based on computer vision
title_full_unstemmed A scalable thin-film defect quantify model under imbalanced regression and classification task based on computer vision
title_short A scalable thin-film defect quantify model under imbalanced regression and classification task based on computer vision
title_sort scalable thin-film defect quantify model under imbalanced regression and classification task based on computer vision
topic Review Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9971186/
https://www.ncbi.nlm.nih.gov/pubmed/36865455
http://dx.doi.org/10.1016/j.heliyon.2023.e13701
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