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A scalable thin-film defect quantify model under imbalanced regression and classification task based on computer vision
Optical coating damage detection is a part of both industrial production and scientific research. Traditional methods require sophisticated expert systems or experienced front-line producers, and the cost of these methods rises dramatically when film types or inspection environments change. In pract...
Autores principales: | , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Elsevier
2023
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9971186/ https://www.ncbi.nlm.nih.gov/pubmed/36865455 http://dx.doi.org/10.1016/j.heliyon.2023.e13701 |
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author | Yang, Guoliang Zhou, Gaohao Wang, Changyuan Mu, Jing Yang, Zhenhu Li, Yuan Su, Junhong |
author_facet | Yang, Guoliang Zhou, Gaohao Wang, Changyuan Mu, Jing Yang, Zhenhu Li, Yuan Su, Junhong |
author_sort | Yang, Guoliang |
collection | PubMed |
description | Optical coating damage detection is a part of both industrial production and scientific research. Traditional methods require sophisticated expert systems or experienced front-line producers, and the cost of these methods rises dramatically when film types or inspection environments change. In practice, it has been found that customized expert systems imply a significant investment of time and money, and we expect to find a method that can perform this task automatically and quickly, while at the same time the method should be adaptable to the later addition of coating types and the ability to identify damage kinds. In this paper, we propose a deep neural network-based detection tool that splits the task into two parts: damage classification and damage degree regression. Introduces attention mechanisms and Embedding operations to enhance the performance of the model. It was found that the damage type detection accuracy of our model reached 93.65%, and the regression loss was kept within 10% on different data sets. We believe that deep neural networks have great potential to tackle industrial defect detection by significantly reducing the design cost and time of traditional expert systems, while gaining the ability to detect entirely new damage types at a fraction of the cost. |
format | Online Article Text |
id | pubmed-9971186 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2023 |
publisher | Elsevier |
record_format | MEDLINE/PubMed |
spelling | pubmed-99711862023-03-01 A scalable thin-film defect quantify model under imbalanced regression and classification task based on computer vision Yang, Guoliang Zhou, Gaohao Wang, Changyuan Mu, Jing Yang, Zhenhu Li, Yuan Su, Junhong Heliyon Review Article Optical coating damage detection is a part of both industrial production and scientific research. Traditional methods require sophisticated expert systems or experienced front-line producers, and the cost of these methods rises dramatically when film types or inspection environments change. In practice, it has been found that customized expert systems imply a significant investment of time and money, and we expect to find a method that can perform this task automatically and quickly, while at the same time the method should be adaptable to the later addition of coating types and the ability to identify damage kinds. In this paper, we propose a deep neural network-based detection tool that splits the task into two parts: damage classification and damage degree regression. Introduces attention mechanisms and Embedding operations to enhance the performance of the model. It was found that the damage type detection accuracy of our model reached 93.65%, and the regression loss was kept within 10% on different data sets. We believe that deep neural networks have great potential to tackle industrial defect detection by significantly reducing the design cost and time of traditional expert systems, while gaining the ability to detect entirely new damage types at a fraction of the cost. Elsevier 2023-02-11 /pmc/articles/PMC9971186/ /pubmed/36865455 http://dx.doi.org/10.1016/j.heliyon.2023.e13701 Text en © 2023 The Authors https://creativecommons.org/licenses/by-nc-nd/4.0/This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/). |
spellingShingle | Review Article Yang, Guoliang Zhou, Gaohao Wang, Changyuan Mu, Jing Yang, Zhenhu Li, Yuan Su, Junhong A scalable thin-film defect quantify model under imbalanced regression and classification task based on computer vision |
title | A scalable thin-film defect quantify model under imbalanced regression and classification task based on computer vision |
title_full | A scalable thin-film defect quantify model under imbalanced regression and classification task based on computer vision |
title_fullStr | A scalable thin-film defect quantify model under imbalanced regression and classification task based on computer vision |
title_full_unstemmed | A scalable thin-film defect quantify model under imbalanced regression and classification task based on computer vision |
title_short | A scalable thin-film defect quantify model under imbalanced regression and classification task based on computer vision |
title_sort | scalable thin-film defect quantify model under imbalanced regression and classification task based on computer vision |
topic | Review Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9971186/ https://www.ncbi.nlm.nih.gov/pubmed/36865455 http://dx.doi.org/10.1016/j.heliyon.2023.e13701 |
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