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Dielectric Properties of Polymer Nanocomposite Interphases Using Electrostatic Force Microscopy and Machine Learning
[Image: see text] Knowing the dielectric properties of the interfacial region in polymer nanocomposites is critical to predicting and controlling dielectric properties. They are, however, difficult to characterize due to their nanoscale dimensions. Electrostatic force microscopy (EFM) provides a pat...
Autores principales: | , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
American Chemical Society
2023
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Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9979787/ https://www.ncbi.nlm.nih.gov/pubmed/36873258 http://dx.doi.org/10.1021/acsaelm.2c01331 |
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author | Gupta, Praveen Ruzicka, Eric Benicewicz, Brian C. Sundararaman, Ravishankar Schadler, Linda S. |
author_facet | Gupta, Praveen Ruzicka, Eric Benicewicz, Brian C. Sundararaman, Ravishankar Schadler, Linda S. |
author_sort | Gupta, Praveen |
collection | PubMed |
description | [Image: see text] Knowing the dielectric properties of the interfacial region in polymer nanocomposites is critical to predicting and controlling dielectric properties. They are, however, difficult to characterize due to their nanoscale dimensions. Electrostatic force microscopy (EFM) provides a pathway to local dielectric property measurements, but extracting local dielectric permittivity in complex interphase geometries from EFM measurements remains a challenge. This paper demonstrates a combined EFM and machine learning (ML) approach to measuring interfacial permittivity in 50 nm silica particles in a PMMA matrix. We show that ML models trained to finite-element simulations of the electric field profile between the EFM tip and nanocomposite surface can accurately determine the interface permittivity of functionalized nanoparticles. It was found that for the particles with a polyaniline brush layer, the interfacial region was detectable (extrinsic interface). For bare silica particles, the intrinsic interface was detectable only in terms of having a slightly higher or lower permittivity. This approach fully accounts for the complex interplay of filler, matrix, and interface permittivity on the force gradients measured in EFM that are missed by previous semianalytic approaches, providing a pathway to quantify and design nanoscale interface dielectric properties in nanodielectric materials. |
format | Online Article Text |
id | pubmed-9979787 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2023 |
publisher | American Chemical Society |
record_format | MEDLINE/PubMed |
spelling | pubmed-99797872023-03-03 Dielectric Properties of Polymer Nanocomposite Interphases Using Electrostatic Force Microscopy and Machine Learning Gupta, Praveen Ruzicka, Eric Benicewicz, Brian C. Sundararaman, Ravishankar Schadler, Linda S. ACS Appl Electron Mater [Image: see text] Knowing the dielectric properties of the interfacial region in polymer nanocomposites is critical to predicting and controlling dielectric properties. They are, however, difficult to characterize due to their nanoscale dimensions. Electrostatic force microscopy (EFM) provides a pathway to local dielectric property measurements, but extracting local dielectric permittivity in complex interphase geometries from EFM measurements remains a challenge. This paper demonstrates a combined EFM and machine learning (ML) approach to measuring interfacial permittivity in 50 nm silica particles in a PMMA matrix. We show that ML models trained to finite-element simulations of the electric field profile between the EFM tip and nanocomposite surface can accurately determine the interface permittivity of functionalized nanoparticles. It was found that for the particles with a polyaniline brush layer, the interfacial region was detectable (extrinsic interface). For bare silica particles, the intrinsic interface was detectable only in terms of having a slightly higher or lower permittivity. This approach fully accounts for the complex interplay of filler, matrix, and interface permittivity on the force gradients measured in EFM that are missed by previous semianalytic approaches, providing a pathway to quantify and design nanoscale interface dielectric properties in nanodielectric materials. American Chemical Society 2023-01-19 /pmc/articles/PMC9979787/ /pubmed/36873258 http://dx.doi.org/10.1021/acsaelm.2c01331 Text en © 2023 The Authors. Published by American Chemical Society https://creativecommons.org/licenses/by-nc-nd/4.0/Permits non-commercial access and re-use, provided that author attribution and integrity are maintained; but does not permit creation of adaptations or other derivative works (https://creativecommons.org/licenses/by-nc-nd/4.0/). |
spellingShingle | Gupta, Praveen Ruzicka, Eric Benicewicz, Brian C. Sundararaman, Ravishankar Schadler, Linda S. Dielectric Properties of Polymer Nanocomposite Interphases Using Electrostatic Force Microscopy and Machine Learning |
title | Dielectric Properties
of Polymer Nanocomposite Interphases
Using Electrostatic Force Microscopy and Machine Learning |
title_full | Dielectric Properties
of Polymer Nanocomposite Interphases
Using Electrostatic Force Microscopy and Machine Learning |
title_fullStr | Dielectric Properties
of Polymer Nanocomposite Interphases
Using Electrostatic Force Microscopy and Machine Learning |
title_full_unstemmed | Dielectric Properties
of Polymer Nanocomposite Interphases
Using Electrostatic Force Microscopy and Machine Learning |
title_short | Dielectric Properties
of Polymer Nanocomposite Interphases
Using Electrostatic Force Microscopy and Machine Learning |
title_sort | dielectric properties
of polymer nanocomposite interphases
using electrostatic force microscopy and machine learning |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9979787/ https://www.ncbi.nlm.nih.gov/pubmed/36873258 http://dx.doi.org/10.1021/acsaelm.2c01331 |
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