Reversible Ultrathin PtO(x) Formation at the Buried Pt/YSZ(111) Interface Studied In Situ under Electrochemical Polarization

[Image: see text] Three different platinum oxides are observed by in situ X-ray diffraction during electrochemical potential cycles of platinum thin film model electrodes on yttria-stabilized zirconia (YSZ) at a temperature of 702 K in air. Scanning electron microscopy and atomic force microscopy performed before and after the in situ electrochemical X-ray experiments indicate that approximately 20% of the platinum electrode has locally delaminated from the substrate by forming pyramidlike blisters. The oxides and their locations are identified as (1) an ultrathin PtO(x) at the buried Pt/YSZ interface, which forms reversibly upon anodic polarization; (2) polycrystalline β-PtO(2), which forms irreversibly upon anodic polarization on the inside of the blisters; and (3) an ultrathin α-PtO(2) at the Pt/air interface, which forms by thermal oxidation and which does not depend on the electrochemical polarization. Thermodynamic and kinetic aspects are discussed to explain the coexistence of multiple phases at the same electrochemical conditions.