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41“…This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. …”
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42por Zahmatkeshsaredorahi, Amirhossein, Jakob, Devon S., Fang, Hui, Fakhraai, Zahra, Xu, Xiaoji G.“…[Image: see text] Kelvin probe force microscopy measures surface potential and delivers insights into nanoscale electronic properties, including work function, doping levels, and localized charges. …”
Publicado 2023
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43por Vieland, Veronica J., Huang, Yungui, Seok, Sang-Cheol, Burian, John, Catalyurek, Umit, O'Connell, Jeffrey, Segre, Alberto, Valentine-Cooper, William“…This paper describes the software package KELVIN, which supports the PPL (posterior probability of linkage) framework for the measurement of statistical evidence in human (or more generally, diploid) genetic studies. …”
Publicado 2011
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44por Gow, Brian J., Cheng, Justine L., Baikie, Iain D., Martinsen, Ørjan G., Zhao, Min, Smith, Stephanie, Ahn, Andrew C.“…However, confounders arising from skin-to-electrode contact used in traditional electrodermal methods have contributed to controversies over this claim. The Scanning Kelvin Probe is a state-of-the-art device that measures electrical potential without actually touching the skin and is thus capable of overcoming these confounding effects. …”
Publicado 2012
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46por Schulz, Fabian, Ritala, Juha, Krejčí, Ondrej, Seitsonen, Ari Paavo, Foster, Adam S., Liljeroth, Peter“…Here, we investigate elemental contrast by carrying out both nc-AFM and Kelvin probe force microscopy (KPFM) experiments on epitaxial monolayer hexagonal boron nitride (hBN) on Ir(111). …”
Publicado 2018
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47“…Moreover, we show that particles can excite Kelvin waves on the vortex filament through a resonance mechanism even if they are still far from it.…”
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49por Hwang, K.‐J., Dokgo, K., Choi, E., Burch, J. L., Sibeck, D. G., Giles, B. L., Hasegawa, H., Fu, H. S., Liu, Y., Wang, Z., Nakamura, T. K. M., Ma, X., Fear, R. C., Khotyaintsev, Y., Graham, D. B., Shi, Q. Q., Escoubet, C. P., Gershman, D. J., Paterson, W. R., Pollock, C. J., Ergun, R. E., Torbert, R. B., Dorelli, J. C., Avanov, L., Russell, C. T., Strangeway, R. J.“…The boundary‐normal analysis shows that the fluctuations can be attributed to nonlinear Kelvin‐Helmholtz (KH) waves. Reconnection signatures such as flow reversals and Joule dissipation were identified at the leading and trailing edges of the flux rope. …”
Publicado 2020
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50“…In this study, we propose the method of AC bias Kelvin probe force microscopy (AC-KPFM), which controls the AC bias to nullify the modulated signal. …”
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51por Roma-Dollase, David, Gualani, Vivek, Gohlke, Martin, Abich, Klaus, Morales, Jordan, Gonzalvez, Alba, Martín, Victor, Ramos-Castro, Juan, Sanjuan, Josep, Nofrarias, MiquelEnlace del recurso
Publicado 2022
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52“…The recently proposed high–low Kelvin probe force microscopy (KPFM) enables evaluation of the effects of semiconductor interface states with high spatial resolution using high and low AC bias frequencies compared with the cutoff frequency of the carrier transfer between the interface and bulk states. …”
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53“…Here we cool excitons to sub-Kelvin temperature and spatially confine them to realize the critical number for BEC. …”
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54por Ma, Zong-Min, Mu, Ji-Liang, Tang, Jun, Xue, Hui, Zhang, Huan, Xue, Chen-Yang, Liu, Jun, Li, Yan-Jun“…In this paper, the potential sensitivity in Kelvin probe force microscopy (KPFM) was investigated in frequency modulation (FM) and heterodyne amplitude modulation (AM) modes. …”
Publicado 2013
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55por Yokouchi, Mariko, Atsugi, Toru, van Logtestijn, Mark, Tanaka, Reiko J, Kajimura, Mayumi, Suematsu, Makoto, Furuse, Mikio, Amagai, Masayuki, Kubo, Akiharu“…Using intimate in vivo 3D imaging, we found that the basic shape of TJ-bearing cells is a flattened Kelvin's tetrakaidecahedron (f-TKD), an optimal shape for filling space. …”
Publicado 2016
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56por Li, Da-Bing, Sun, Xiao-Juan, Jia, Yu-Ping, Stockman, Mark I, Paudel, Hari P, Song, Hang, Jiang, Hong, Li, Zhi-Ming“…To reveal the physical origin of this enhancement, Kelvin probe force microscopy (KPFM) was used to observe the SP-induced surface potential reduction in the vicinity of Ag nanoparticles on a GaN epilayer. …”
Publicado 2017
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57“…Cross-sectional potential distribution of high open-circuit voltage bulk heterojunction photovoltaic device was measured using Kelvin probe force microscopy. Potential drop confined at cathode interface implies that photo-active layer is an effective p-type semiconductor. …”
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58por Marzano, Martina, Kruskopf, Mattias, Panna, Alireza R., Rigosi, Albert F., Patel, Dinesh K., Jin, Hanbyul, Cular, Stefan, Callegaro, Luca, Elmquist, Randolph E., Ortolano, Massimo“…In this paper we present the first realization of a quantum Hall Kelvin bridge for the calibration of standard resistors directly against the quantum Hall resistance. …”
Publicado 2020
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59“…Kelvin probe force microscopy is a scanning probe technique used to quantify the local electrostatic potential of a surface. …”
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60por Drolle, Elizabeth, Ngo, William, Leonenko, Zoya, Subbaraman, Lakshman, Jones, Lyndon“…PURPOSE: To describe the use of Kelvin probe force microscopy (KPFM) to investigate the electrical surface potential of human meibum and to demonstrate successful use of this instrument on both human meibum and a meibum model system (six-lipid stock [6LS]) to elucidate nanoscale surface chemistry and self-assembly characteristics. …”
Publicado 2020
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