“…To distinguish clearly the origin of the tip–sample forces we propose to use a combination of Kelvin probe force microscopy (KPFM) and MFM. The KPFM technique allows us to compensate in real time the electrostatic forces between the tip and the sample by minimizing the electrostatic contribution to the frequency shift signal. …”
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“…In this study, the Φ(s)s of PC12 cell plasma membranes were measured by atomic force microscopy in Kelvin probe mode (KPFM). The skewness values of the Φ(s)s distribution histogram were found to be mostly negative, and the incorporation of negatively charged phosphatidylserine shifted the average skewness values to positive. …”
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“…In this study, we propose an ultra-facile approach to prepare a platinum silicide nanoparticle-modified tip apex (PSM tip) used for scanning Kelvin probe microscopy (SKPM). We combined a localized fluoride-assisted galvanic replacement reaction (LFAGRR) and atmospheric microwave annealing (AMA) to deposit a single platinum silicide nanoparticle with a diameter of 32 nm on the apex of a bare silicon tip of atomic force microscopy (AFM). …”
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“…This paper presents an induced voltage linear extraction method for disturbing force self-sensing in the application of giant magnetostrictive actuators (GMAs). In this method, a Kelvin bridge combined with an active device is constructed instead of a conventional Wheatstone bridge for extraction of the induced voltage, and an additional GMA is adopted as a reference actuator in the self-sensing circuit in order to balance the circuit bridge. …”
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“…Kelvin probe force microscopy (KPFM) has provided deep insights into the local electronic, ionic and electrochemical functionalities in a broad range of materials and devices. …”
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“…On the other hand, the Kelvin principle states that it is impossible to completely convert heat into work. …”
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“…In electrochemical measurements, monitoring the electrode potential using a stable reference is essential for controlling the redox reactions that occur at the electrodes. In Kelvin probe force microscopy (KPFM) measurements on electrochemical cells, the surface potential is generally measured relative to electrical ground instead of a stable reference. …”
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“…We present an investigation of the Cu(3)BiS(3) absorber layer and the junction formation with CdS, ZnS and In(2)S(3) buffer layers. Kelvin probe force microscopy shows the granular structure of the buffer layers with small grains of 20–100 nm, and a considerably smaller work-function distribution for In(2)S(3) compared to that of CdS and ZnS. …”
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“…Recent observations have shown that bulk flow motions in structured solar plasmas, most evidently in coronal mass ejections (CMEs), may lead to the formation of Kelvin–Helmholtz instabilities (KHIs). Analytical models are thus essential in understanding both how the flows affect the propagation of magnetohydrodynamic (MHD) waves, and what the critical flow speed is for the formation of the KHI. …”
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“…In this study, we measured the contact potential difference around the steps on a rutile TiO(2)(110)-(1 × 1) surface with O(2) exposure using Kelvin probe force microscopy. A drop in contact potential difference was observed at the steps, indicating that the work function locally decreased. …”
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“…The Schottky barrier formed by the 1D and 2D nanoinclusions was characterized by means of atomic force microscopy (AFM). We used Kelvin probe force microscopy (KPFM) in ambient atmosphere at the nanoscale and compared the results to those of ultraviolet photoelectron spectroscopy (UPS) in UHV at the macroscale. …”
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“…The thermodynamics of fluids in confined (capillary) media is different from the bulk conditions due to the effects of the surface tension, wettability, and pore radius as described by the classical Kelvin equation. This study provides experimental data showing the deviation of propane vapour pressures in capillary media from the bulk conditions. …”
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“…In this work, a novel AlGaN/GaN device with the Kelvin connection structure and the corresponding detection technique was proposed. …”
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“…In this paper, the surface potentials of the ±(0001)-polar plane of HZO (Zn-polar plane and O-polar plane), graphene, graphene/Zn-polar plane and graphene/O-polar plane were measured using Kelvin probe force microscopy (KPFM). On the basis of the KPFM results, the respective Fermi levels were calculated and the internal electric field (IEF) of HZO was confirmed. …”
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“…We demonstrate that single-pass Kelvin force microscopy (KFM) and capacitance gradient (dC/dZ) measurements with force gradient detection of tip–sample electrostatic interactions can be performed in the intermittent contact regime in different environments. …”
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“…We report on photovoltage and photocurrent measurements with nanometer scale resolution performed on the cross section of an epitaxial crystalline silicon solar cell, using respectively Kelvin probe force microscopy and conducting probe atomic force microscopy. …”
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“…Self-assembled donor–acceptor dyads are used as model nanostructured heterojunctions for local investigations by noncontact atomic force microscopy (nc-AFM) and Kelvin probe force microscopy (KPFM). With the aim to probe the photo-induced charge carrier generation, thin films deposited on transparent indium tin oxide substrates are investigated in dark conditions and upon illumination. …”
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“…In this work, methylammonium lead tribromide (MAPbBr(3)) single crystals are studied by noncontact atomic force microscopy (nc-AFM) and Kelvin probe force microscopy (KPFM). We demonstrate that the surface photovoltage and crystal photostriction can be simultaneously investigated by implementing a specific protocol based on the acquisition of the tip height and surface potential during illumination sequences. …”
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“…As the majority of applications involve the use of heterostructures, the most suitable characterization technique is Kelvin probe force microscopy (KPFM), which provides excellent energetic and lateral resolution. …”
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