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“…The open-loop (OL) variant of Kelvin probe force microscopy (KPFM) provides access to the voltage response of the electrostatic interaction between a conductive atomic force microscopy (AFM) probe and the investigated sample. …”
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“…The obtained material was used as a model to demonstrate that a combination of polarization relaxation measurements and Kelvin probe force microscopy (KPFM)-based mapping of the Volta potential before and after the end of polarization can be used to determine the chemical diffusion coefficient of the ceria component of the composite. …”
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“…We investigated the surface work function (W(S)) and its spatial distribution for epitaxial VO(2)/TiO(2) thin films using Kelvin probe force microscopy (KPFM). Nearly grain-boundary-free samples allowed observation of metallic and insulating domains with distinct W(S) values, throughout the metal–insulator transition. …”
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“…Two nonlinear evolution equations, namely the Kadomtsev-Petviashvili (KP) equation which describes the dynamics of soliton and nonlinear wave in the field of fluid dynamics, plasma physics and the Oskolkov equation which describes the dynamics of an incompressible visco-elastic Kelvin-Voigt fluid are investigated. We deliberate exact traveling wave solutions, specially kink wave, cusp wave, periodic breather waves and periodic wave solutions of the models applying the modified simple equation method. …”
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“…This work focuses on the extraction of the open circuit voltage (V(OC)) on photovoltaic nanowires by surface photovoltage (SPV) based on Kelvin probe force microscopy (KPFM) measurements. …”
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“…Here, we employ correlative infrared-spectroscopic nanoimaging by the scattering-type scanning near-field optical microscopy with 20 nm spatial resolution and Kelvin probe force microscopy to quantify the density of electrons accumulated at the GBs in perovskite polycrystalline thin films. …”
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“…TMDs were deposited on SiO(2)/silicon wafers by chemical vapor deposition and transferred to Al and Au substrates, with significantly different WFs to identify the metal–semiconductor junction behavior: oxide-terminated Al (natural oxidation) and Au (UV–ozone oxidation) with a WF difference of 0.8 eV. Kelvin probe force microscopy was employed for this study, based on which electronic band diagrams for each case were determined. …”
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“…Numerical solutions of the RSWE show that the resulting Rossby, Poincaré and “Kelvin‐like” waves differ from their counterparts without mean flow in both their phase speeds and meridional structures. …”
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“…In the present paper, the laser-induced cavitation bubble dynamics near a fixed spherical particle is comprehensively investigated based on the Weiss theorem, the Kelvin impulse theory and the high-speed photography experiment. …”
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“…In this work, a silicon photodiode integrated with a piezoelectric membrane is studied by Kelvin probe force microscopy (KPFM) under modulated illumination. …”
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“…This article provides data on the scanning tunnelling microscopy (STM), atomic force microscopy (AFM) and Kelvin probe force microscopy (KPFM) images of InAs(001) surface. …”
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“…A catalyst model comprising platinum nanoparticles deposited on a TiO(2)(110) wafer was prepared in a vacuum, transferred in air, and characterized with a Kelvin probe force microscope placed in a N(2) environment. …”
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“…Various analytical techniques, including Scanning Probe Microscopy (SPM), X-ray Diffraction (XRD), Kelvin Probe Force Microscopy (KPFM), UV-visible absorption, and Photoluminescence, were employed to characterize the produced Ag nanoclusters. …”
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“…The aggregates are characterized electrically by Kelvin probe force microscopy and conductive atomic force microscopy (C-AFM), whereby the correlation between local electrical potential and current confirms a defective charge transport. …”
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“…We describe the general aspects of this simulation routine and we compare it against experimental results previously obtained using single-point Kelvin probe force microscopy under frequency-modulated excitation over a silicon nanocrystal solar cell, as well as against results obtained by intensity-modulated scanning Kelvin probe microscopy over a polymer/fullerene bulk heterojunction device. …”
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“…We directly measure the electric dipole of InN quantum dots (QDs) grown on In-rich InGaN layers by Kelvin probe force microscopy. This significantly advances the understanding of the superior catalytic performance of InN/InGaN QDs in ion- and biosensing and in photoelectrochemical hydrogen generation by water splitting and the understanding of the important third-generation InGaN semiconductor surface in general. …”
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“…We set up a new model of torsional oscillations of a complex discrete, biodynamical system, using the Kelvin–Voigt visco-elastic model involving a fractional-order time derivative. …”
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