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  1. 1901
  2. 1902
  3. 1903
    “…In this paper, the top-contact (TC) pentacene-based organic thin-film transistor (OTFT) with a tetrafluorotetracyanoquinodimethane (F(4)TCNQ)-doped pentacene interlayer between the source/drain electrodes and the pentacene channel layer were fabricated using the co-evaporation method. …”
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  4. 1904
    “…We further investigate the performance behavior of organic field-effect transistors based on a semiconducting liquid-crystal polymer (LCP) using both dielectric materials and evaluate the results regarding the processability. …”
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  5. 1905
    “…Herein, a new strategy for highly sensitive protein detection at sub‐femtomolar levels without any labelling has been demonstrated by using an organic field‐effect transistor (OFET). An artificial histidine‐rich protein receptor (Ni(II)‐nitrilotriacetic acid complex, Ni(II)‐nta) functionalizes a detection portion (i.e. an extended‐gate electrode) of the fabricated OFET device. …”
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  6. 1906
    “…In that regard, organic filed‐effect transistors (OFETs) are some of the most promising platforms for construction of on‐site testing systems. …”
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  7. 1907
    “…We introduced a novel water-gated field effect transistor (WG-FET) which uses 16-nm-thick mono-Si film as active layer. …”
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  8. 1908
    “…In this study, the initial electrical properties, positive gate bias stress (PBS), and drain current stress (DCS)-induced instabilities of amorphous indium gallium zinc oxide (a-IGZO) thin-film transistors (TFTs) with various active layer thicknesses (T(IGZO)) are investigated. …”
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  9. 1909
    “…Few-layer 2H-MoTe(2) with an amorphous boron nitride (a-BN) covering layer was synthesized as a channel for back-gated field effect transistors (FET) and compared to uncovered MoTe(2). …”
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  10. 1910
  11. 1911
    “…The DSІ and DSII are composed of four silicon magnetic sensitive transistors (SMST1, SMST2, SMST3 and SMST4) and four collector load resistors (R(L)(1), R(L)(2), R(L)(3) and R(L)(4)). …”
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  12. 1912
    “…In this unique design of the DC flow field-effect-transistor (DC-FFET), a pair of face-to-face external gate terminals are imposed with opposite gate-voltage polarities. …”
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  13. 1913
    “…Al 2.2-atom %-doped SnO(x) thin-film transistors (TFTs) exhibit improved semiconductor characteristics compared to non-doped films, with a lower sub-threshold swing of ~0.68 Vdec(−1), increased on/off current ratio of ~8 × 10(7), threshold voltage (V(th)) near 0 V, and markedly reduced (by 81%) V(th) instability in air, attributable to the decrease in oxygen vacancy defects induced by the strong oxidizing potential of Al. …”
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  14. 1914
    por Seo, Dongwook, Chang, Jiwon
    Publicado 2019
    “…Two-dimensional (2-D) materials such as MoS(2) and phosphorene provide an ideal platform to realize extremely thin body metal-oxide-semiconductor field effect transistors (MOSFETs) which is highly immune to short channel effects in the ultra-scaled regime. …”
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  15. 1915
    “…Surface-emitting organic light-emitting transistors (OLETs) could well be a core element in the next generation of active-matrix (AM) displays. …”
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  16. 1916
    “…[Image: see text] Efficient synthesis and characterization of several piceno[4,3-b:9,10-b′]dithiophene (PiDT) derivatives by Negishi coupling, epoxidation, and Lewis acid-catalyzed cycloaromatization sequences and their potential utility in organic field-effect transistors (OFETs) have been reported. PiDT derivatives, with extended π-electron systems, showed high air stability due to their deep highest occupied molecular orbital energy levels (around −5.6 eV). …”
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  17. 1917
    “…The polymer demonstrates promising performance in a field‐effect transistor device with saturated hole mobility up to 2 cm(2) V(−1) s(−1) obtained under relatively low gate voltages of −30 V. …”
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  18. 1918
    “…The fermi-level pinning phenomenon, which occurs at the metal–semiconductor interface, not only obstructs the achievement of high-performance field effect transistors (FETs) but also results in poor long-term stability. …”
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  19. 1919
    “…The effect of oxygen content on current-stress-induced instability was investigated in bottom-gate amorphous InGaZnO (a-IGZO) thin-film transistors. The observed positive threshold voltage shift (ΔV(T)) was dominated by electron trapping in the gate insulator (GI), whereas it was compensated by donor creation in a-IGZO active regions when both current flows and a high lateral electric field were present. …”
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  20. 1920
    “…In organic thin-film transistors, such morphological changes in the blend induce a positive effect on the field-effect mobility, as the mobility is ~5–7 times higher than in the pristine P3HT. …”
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