Mostrando 1,401 - 1,420 Resultados de 43,200 Para Buscar '"film"', tiempo de consulta: 0.23s Limitar resultados
  1. 1401
    por Montesi, M.C., Lauria, A., Alexandrov, A., Solestizi, L. Alunni, Giovanni, Ambrosi, Argirò, S., Diaz, R., Bartosik, N., Battistoni, G., Belcari, N., Bellinzona, E., Bianucci, S., Biondi, S., Bisogni, M.G., Bruni, G., Camarlinghi, N., Carra, P., Cerello, P., Ciarrocchi, E., Clozza, A., Colombi, S., Del Guerra, A., De Simoni, M., Crescenzo, A. Di, Donetti, M., Dong, Y., Durante, M., Embriaco, A., Emde, M., Faccini, R., Ferrero, V., Ferroni, F., Fiandrini, E., Finck, C., Fiorina, E., Fischetti, M., Francesconi, M., Franchini, M., Galati, G., Galli, L., Garbini, M., Gentile, V., Giraudo, G., Hetzel, R., Iarocci, E., Ionica, M., Kanxheri, K., Kraan, A. C., Lante, V., La Tessa, C., Lopez Torres, E., Marafini, M., Mattei, I., Mengarelli, A., Mirabelli, R., Moggi, A., Morone, M.C., Morrocchi, M., Muraro, S., Narici, L., Pastore, A., Pastrone, N., Patera, V., Pennazio, F., Placidi, P., Pullia, M., Raffaelli, F., Ramello, L., Ridolfi, R., Rosso, V., Rovituso, M., Sanelli, C., Sarti, A., Sartorelli, G., Sato, O., Savazzi, S., Scavarda, L., Schiavi, A., Schuy, C., Scifoni, E., Sciubba, A., Sécher, A., Selvi, M., Servoli, L., Silvestre, G., Sitta, M., Spighi, R., Spiriti, E., Sportelli, G., Stahl, A., Tioukov, V., Tomassini, S., Tommasino, F., Traini, G., Valle, S.M., Vanstalle, M., Villa, M., Weber, U., Zoccoli, A., Lellis, G. De
    Publicado 2019
    “…In this study the performances in terms of charge separation of proton, helium and carbon particles, obtained on a batch of new emulsion films produced in Japan are reported.…”
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  2. 1402
  3. 1403
  4. 1404
  5. 1405
  6. 1406
  7. 1407
  8. 1408
  9. 1409
  10. 1410
  11. 1411
    “…Discharge gas trapping in thin films produced by sputtering is known to be due to high energy neutrals bouncing back from the cathode. …”
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  12. 1412
  13. 1413
  14. 1414
  15. 1415
  16. 1416
  17. 1417
    por Prodromides, A E
    Publicado 2002
    “…XRD measurements prove that depending on their composition, the TiZrV coatings can be grouped into two families which are sharply separated with respect to their grain size: polycrystalline films, with grain size above 100 nm and nanocrystalline films with grain size below 5 nm. …”
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  18. 1418
    “…New data on the amount of sputter gas implanted in thin films are presented, complementing the results reported in the note CERN-EST-99-005-SM, published in Vacuum, Vol. 60, 1-2 (2001) Pp. 89-94. …”
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  19. 1419
    por Osuji, R U
    Publicado 2002
    “…X-ray analysis confirmed the successful deposition of CdSe and CdS thin films. Our grown CdSe film thickness ranged from 0.10 $\mu$m. to 0.80 $\pm$ 0.01 $\mu$m and the CdS film thickness ranged from 0.10 $\mu$m to 1.00 $\pm$ 0.01 $\mu$m. …”
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  20. 1420
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