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76Functional Testing and Characterisation of ISFETs on Wafer Level by Means of a Micro-droplet Cell(#)por Poghossian, Arshak, Schumacher, Kerstin, Kloock, Joachim P., Rosenkranz, Christian, Schultze, Joachim W., Müller-Veggian, Mattea, Schöning, Michael J.Enlace del recurso
Publicado 2006
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