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Minimum Bias and Underlying Event at CMS
The prospects of measuring minimum bias collisions (MB) and studying the underlying event (UE) at CMS are discussed. Two methods are described. The first is based on the measurement of charged tracks in the transverse region with respect to a charge-particle jet. The second technique relies on the s...
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| Lenguaje: | eng |
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2006
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| Acceso en línea: | http://cds.cern.ch/record/1000410 |