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Low-noise design issues for analog front-end electronics in 130 nm and 90 nm CMOS technologies

Deep sub-micron CMOS technologies provide wellestablished solutions to the implementation of low-noise front-end electronics in various detector applications. The IC designers’ effort is presently shifting to 130 nm CMOS technologies, or even to the next technology node, to implement readout integra...

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Detalles Bibliográficos
Autores principales:	Manghisoni, M, Ratti, L, Re, V, Speziali, V, Traversi, G
Lenguaje:	eng
Publicado:	CERN 2007
Materias:	Detectors and Experimental Techniques
Acceso en línea:	https://dx.doi.org/10.5170/CERN-2007-001.483 http://cds.cern.ch/record/1034304

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