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Micro-pattern technology gets set for more challenges

Detalles Bibliográficos
Autores principales: Cattai, A, Revol, Jean Pierre Charles
Lenguaje:eng
Publicado: 2006
Materias:
Acceso en línea:http://cds.cern.ch/record/1035640
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author Cattai, A
Revol, Jean Pierre Charles
author_facet Cattai, A
Revol, Jean Pierre Charles
author_sort Cattai, A
collection CERN
id cern-1035640
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2006
record_format invenio
spelling cern-10356402019-09-30T06:29:59Zhttp://cds.cern.ch/record/1035640engCattai, ARevol, Jean Pierre CharlesMicro-pattern technology gets set for more challengesDetectors and Experimental Techniquesoai:cds.cern.ch:10356402006
spellingShingle Detectors and Experimental Techniques
Cattai, A
Revol, Jean Pierre Charles
Micro-pattern technology gets set for more challenges
title Micro-pattern technology gets set for more challenges
title_full Micro-pattern technology gets set for more challenges
title_fullStr Micro-pattern technology gets set for more challenges
title_full_unstemmed Micro-pattern technology gets set for more challenges
title_short Micro-pattern technology gets set for more challenges
title_sort micro-pattern technology gets set for more challenges
topic Detectors and Experimental Techniques
url http://cds.cern.ch/record/1035640
work_keys_str_mv AT cattaia micropatterntechnologygetssetformorechallenges
AT revoljeanpierrecharles micropatterntechnologygetssetformorechallenges