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Micro-pattern technology gets set for more challenges
Autores principales: | , |
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Lenguaje: | eng |
Publicado: |
2006
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/1035640 |
_version_ | 1780912509476143104 |
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author | Cattai, A Revol, Jean Pierre Charles |
author_facet | Cattai, A Revol, Jean Pierre Charles |
author_sort | Cattai, A |
collection | CERN |
id | cern-1035640 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2006 |
record_format | invenio |
spelling | cern-10356402019-09-30T06:29:59Zhttp://cds.cern.ch/record/1035640engCattai, ARevol, Jean Pierre CharlesMicro-pattern technology gets set for more challengesDetectors and Experimental Techniquesoai:cds.cern.ch:10356402006 |
spellingShingle | Detectors and Experimental Techniques Cattai, A Revol, Jean Pierre Charles Micro-pattern technology gets set for more challenges |
title | Micro-pattern technology gets set for more challenges |
title_full | Micro-pattern technology gets set for more challenges |
title_fullStr | Micro-pattern technology gets set for more challenges |
title_full_unstemmed | Micro-pattern technology gets set for more challenges |
title_short | Micro-pattern technology gets set for more challenges |
title_sort | micro-pattern technology gets set for more challenges |
topic | Detectors and Experimental Techniques |
url | http://cds.cern.ch/record/1035640 |
work_keys_str_mv | AT cattaia micropatterntechnologygetssetformorechallenges AT revoljeanpierrecharles micropatterntechnologygetssetformorechallenges |