International Symposium on Nanometer Structure Electronics : an Investigation of the Future of Microelectronics

Detalles Bibliográficos
Autores principales: Fujisawa, Toshio, Namba, Susumu, Yamamura, Yuichi
Lenguaje:eng
Publicado: North-Holland 1985
Materias:
Engineering
Acceso en línea:http://cds.cern.ch/record/106468

Internet

http://cds.cern.ch/record/106468

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