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International Symposium on Nanometer Structure Electronics : an Investigation of the Future of Microelectronics
| Autores principales: | , , |
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| Lenguaje: | eng |
| Publicado: |
North-Holland
1985
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/106468 |
| _version_ | 1780877439792054272 |
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| author | Fujisawa, Toshio Namba, Susumu Yamamura, Yuichi |
| author_facet | Fujisawa, Toshio Namba, Susumu Yamamura, Yuichi |
| author_sort | Fujisawa, Toshio |
| collection | CERN |
| id | cern-106468 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1985 |
| publisher | North-Holland |
| record_format | invenio |
| spelling | cern-1064682021-04-22T22:02:22Zhttp://cds.cern.ch/record/106468engFujisawa, ToshioNamba, SusumuYamamura, YuichiInternational Symposium on Nanometer Structure Electronics : an Investigation of the Future of MicroelectronicsEngineeringNorth-Hollandoai:cds.cern.ch:1064681985 |
| spellingShingle | Engineering Fujisawa, Toshio Namba, Susumu Yamamura, Yuichi International Symposium on Nanometer Structure Electronics : an Investigation of the Future of Microelectronics |
| title | International Symposium on Nanometer Structure Electronics : an Investigation of the Future of Microelectronics |
| title_full | International Symposium on Nanometer Structure Electronics : an Investigation of the Future of Microelectronics |
| title_fullStr | International Symposium on Nanometer Structure Electronics : an Investigation of the Future of Microelectronics |
| title_full_unstemmed | International Symposium on Nanometer Structure Electronics : an Investigation of the Future of Microelectronics |
| title_short | International Symposium on Nanometer Structure Electronics : an Investigation of the Future of Microelectronics |
| title_sort | international symposium on nanometer structure electronics : an investigation of the future of microelectronics |
| topic | Engineering |
| url | http://cds.cern.ch/record/106468 |
| work_keys_str_mv | AT fujisawatoshio internationalsymposiumonnanometerstructureelectronicsaninvestigationofthefutureofmicroelectronics AT nambasusumu internationalsymposiumonnanometerstructureelectronicsaninvestigationofthefutureofmicroelectronics AT yamamurayuichi internationalsymposiumonnanometerstructureelectronicsaninvestigationofthefutureofmicroelectronics |