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Performance tests of a new fast digitiser for beam diagnostic applications
A new type of PCI-based fast digitisers has been deployed to implement new beam diagnostic systems and as a prototype for a new family of applications. The modules selected for the first tests and applications are the Acqiris DC265 fast digitiser boards, characterised by a high sampling speed, a lar...
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| Lenguaje: | eng |
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1992
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| Acceso en línea: | http://cds.cern.ch/record/1065155 |