Performance tests of a new fast digitiser for beam diagnostic applications

A new type of PCI-based fast digitisers has been deployed to implement new beam diagnostic systems and as a prototype for a new family of applications. The modules selected for the first tests and applications are the Acqiris DC265 fast digitiser boards, characterised by a high sampling speed, a large amount of memory per channel (2 MSamples per channel as the chosen option) and a PCI bus interface. This note details the tests carried out, and the results obtained, to ascertain the DC265 board and crate suitability to general beam diagnostics applications.