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Performance tests of a new fast digitiser for beam diagnostic applications
A new type of PCI-based fast digitisers has been deployed to implement new beam diagnostic systems and as a prototype for a new family of applications. The modules selected for the first tests and applications are the Acqiris DC265 fast digitiser boards, characterised by a high sampling speed, a lar...
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| Lenguaje: | eng |
| Publicado: |
1992
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| Acceso en línea: | http://cds.cern.ch/record/1065155 |
| _version_ | 1780913258663772160 |
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| author | Angoletta, M E |
| author_facet | Angoletta, M E |
| author_sort | Angoletta, M E |
| collection | CERN |
| description | A new type of PCI-based fast digitisers has been deployed to implement new beam diagnostic systems and as a prototype for a new family of applications. The modules selected for the first tests and applications are the Acqiris DC265 fast digitiser boards, characterised by a high sampling speed, a large amount of memory per channel (2 MSamples per channel as the chosen option) and a PCI bus interface. This note details the tests carried out, and the results obtained, to ascertain the DC265 board and crate suitability to general beam diagnostics applications. |
| id | cern-1065155 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1992 |
| record_format | invenio |
| spelling | cern-10651552023-08-04T20:22:06Zhttp://cds.cern.ch/record/1065155engAngoletta, M EPerformance tests of a new fast digitiser for beam diagnostic applicationsAccelerators and Storage RingsA new type of PCI-based fast digitisers has been deployed to implement new beam diagnostic systems and as a prototype for a new family of applications. The modules selected for the first tests and applications are the Acqiris DC265 fast digitiser boards, characterised by a high sampling speed, a large amount of memory per channel (2 MSamples per channel as the chosen option) and a PCI bus interface. This note details the tests carried out, and the results obtained, to ascertain the DC265 board and crate suitability to general beam diagnostics applications.CERN-PS-BD-Note-2002-216-TECHPS-BD-Note-2002-216-TECHoai:cds.cern.ch:10651551992 |
| spellingShingle | Accelerators and Storage Rings Angoletta, M E Performance tests of a new fast digitiser for beam diagnostic applications |
| title | Performance tests of a new fast digitiser for beam diagnostic applications |
| title_full | Performance tests of a new fast digitiser for beam diagnostic applications |
| title_fullStr | Performance tests of a new fast digitiser for beam diagnostic applications |
| title_full_unstemmed | Performance tests of a new fast digitiser for beam diagnostic applications |
| title_short | Performance tests of a new fast digitiser for beam diagnostic applications |
| title_sort | performance tests of a new fast digitiser for beam diagnostic applications |
| topic | Accelerators and Storage Rings |
| url | http://cds.cern.ch/record/1065155 |
| work_keys_str_mv | AT angolettame performancetestsofanewfastdigitiserforbeamdiagnosticapplications |