Precise half-life measurement of the Si-26 ground state

The beta-decay half-life of 26Si was measured with a relative precision of 1.4*10e3. The measurement yields a value of 2.2283(27) s which is in good agreement with previous measurements but has a precision that is better by a factor of 4. In the same experiment, we have also measured the non-analogu...

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Detalles Bibliográficos
Autores principales: Matea, I., Souin, J., Aysto, J., Blank, B., Delahaye, P., Elomaa, V.V., Eronen, T., Giovinazzo, J., Hager, U., Hakala, J., Huikari, J., Jokinen, A., Kankainen, A., Moore, I.D., Pedroza, J.L., Rahaman, S., Rissanen, J., Ronkainen, J., Saastamoinen, A., Sonoda, T., Weber, C.
Lenguaje:eng
Publicado: 2008
Materias:
Nuclear Physics
Acceso en línea:https://dx.doi.org/10.1140/epja/i2008-10678-2
http://cds.cern.ch/record/1082966

Internet

https://dx.doi.org/10.1140/epja/i2008-10678-2
http://cds.cern.ch/record/1082966

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