Precise half-life measurement of the Si-26 ground state

The beta-decay half-life of 26Si was measured with a relative precision of 1.4*10e3. The measurement yields a value of 2.2283(27) s which is in good agreement with previous measurements but has a precision that is better by a factor of 4. In the same experiment, we have also measured the non-analogu...

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Detalles Bibliográficos
Autores principales: Matea, I., Souin, J., Aysto, J., Blank, B., Delahaye, P., Elomaa, V.V., Eronen, T., Giovinazzo, J., Hager, U., Hakala, J., Huikari, J., Jokinen, A., Kankainen, A., Moore, I.D., Pedroza, J.L., Rahaman, S., Rissanen, J., Ronkainen, J., Saastamoinen, A., Sonoda, T., Weber, C.
Lenguaje:eng
Publicado: 2008
Materias:
Nuclear Physics
Acceso en línea:https://dx.doi.org/10.1140/epja/i2008-10678-2
http://cds.cern.ch/record/1082966
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author Matea, I.
Souin, J.
Aysto, J.
Blank, B.
Delahaye, P.
Elomaa, V.V.
Eronen, T.
Giovinazzo, J.
Hager, U.
Hakala, J.
Huikari, J.
Jokinen, A.
Kankainen, A.
Moore, I.D.
Pedroza, J.L.
Rahaman, S.
Rissanen, J.
Ronkainen, J.
Saastamoinen, A.
Sonoda, T.
Weber, C.
author_facet Matea, I.
Souin, J.
Aysto, J.
Blank, B.
Delahaye, P.
Elomaa, V.V.
Eronen, T.
Giovinazzo, J.
Hager, U.
Hakala, J.
Huikari, J.
Jokinen, A.
Kankainen, A.
Moore, I.D.
Pedroza, J.L.
Rahaman, S.
Rissanen, J.
Ronkainen, J.
Saastamoinen, A.
Sonoda, T.
Weber, C.
author_sort Matea, I.
collection CERN
description The beta-decay half-life of 26Si was measured with a relative precision of 1.4*10e3. The measurement yields a value of 2.2283(27) s which is in good agreement with previous measurements but has a precision that is better by a factor of 4. In the same experiment, we have also measured the non-analogue branching ratios and could determine the super-allowed one with a precision similar to the previously reported measurements. The experiment was done at the Accelerator Laboratory of the University of Jyvaskyla where we used the IGISOL technique with the JYFLTRAP facility to separate pure samples of 26Si.
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institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2008
record_format invenio
spelling cern-10829662019-09-30T06:29:59Zdoi:10.1140/epja/i2008-10678-2http://cds.cern.ch/record/1082966engMatea, I.Souin, J.Aysto, J.Blank, B.Delahaye, P.Elomaa, V.V.Eronen, T.Giovinazzo, J.Hager, U.Hakala, J.Huikari, J.Jokinen, A.Kankainen, A.Moore, I.D.Pedroza, J.L.Rahaman, S.Rissanen, J.Ronkainen, J.Saastamoinen, A.Sonoda, T.Weber, C.Precise half-life measurement of the Si-26 ground stateNuclear PhysicsThe beta-decay half-life of 26Si was measured with a relative precision of 1.4*10e3. The measurement yields a value of 2.2283(27) s which is in good agreement with previous measurements but has a precision that is better by a factor of 4. In the same experiment, we have also measured the non-analogue branching ratios and could determine the super-allowed one with a precision similar to the previously reported measurements. The experiment was done at the Accelerator Laboratory of the University of Jyvaskyla where we used the IGISOL technique with the JYFLTRAP facility to separate pure samples of 26Si.arXiv:0801.4125oai:cds.cern.ch:10829662008-01-29
spellingShingle Nuclear Physics
Matea, I.
Souin, J.
Aysto, J.
Blank, B.
Delahaye, P.
Elomaa, V.V.
Eronen, T.
Giovinazzo, J.
Hager, U.
Hakala, J.
Huikari, J.
Jokinen, A.
Kankainen, A.
Moore, I.D.
Pedroza, J.L.
Rahaman, S.
Rissanen, J.
Ronkainen, J.
Saastamoinen, A.
Sonoda, T.
Weber, C.
Precise half-life measurement of the Si-26 ground state
title Precise half-life measurement of the Si-26 ground state
title_full Precise half-life measurement of the Si-26 ground state
title_fullStr Precise half-life measurement of the Si-26 ground state
title_full_unstemmed Precise half-life measurement of the Si-26 ground state
title_short Precise half-life measurement of the Si-26 ground state
title_sort precise half-life measurement of the si-26 ground state
topic Nuclear Physics
url https://dx.doi.org/10.1140/epja/i2008-10678-2
http://cds.cern.ch/record/1082966
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