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Measurement of the partial ($n,\gamma$) cross section to $^{176}Lu^{m}$ at s-process temperatures
Autores principales: | Winckler, N, Dababneh, S, Heil, M, Käppeler, F, Bisterzo, S, Gallino, R |
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Lenguaje: | eng |
Publicado: |
2006
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/1099520 |
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