International Symposium on Measurement Technology and Intelligent Instrument

Detalles Bibliográficos
Autores principales: Gao, Wei, Takaya, Yasuhiro, Gao, Yongsheng, Krystek, Michael
Lenguaje:eng
Publicado: 2008
Materias:
XX
Acceso en línea:http://cds.cern.ch/record/1120456
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author Gao, Wei
Takaya, Yasuhiro
Gao, Yongsheng
Krystek, Michael
author_facet Gao, Wei
Takaya, Yasuhiro
Gao, Yongsheng
Krystek, Michael
author_sort Gao, Wei
collection CERN
id cern-1120456
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2008
record_format invenio
spelling cern-11204562021-04-25T17:18:19Zhttp://cds.cern.ch/record/1120456engGao, WeiTakaya, YasuhiroGao, YongshengKrystek, MichaelInternational Symposium on Measurement Technology and Intelligent InstrumentXXoai:cds.cern.ch:11204562008
spellingShingle XX
Gao, Wei
Takaya, Yasuhiro
Gao, Yongsheng
Krystek, Michael
International Symposium on Measurement Technology and Intelligent Instrument
title International Symposium on Measurement Technology and Intelligent Instrument
title_full International Symposium on Measurement Technology and Intelligent Instrument
title_fullStr International Symposium on Measurement Technology and Intelligent Instrument
title_full_unstemmed International Symposium on Measurement Technology and Intelligent Instrument
title_short International Symposium on Measurement Technology and Intelligent Instrument
title_sort international symposium on measurement technology and intelligent instrument
topic XX
url http://cds.cern.ch/record/1120456
work_keys_str_mv AT gaowei internationalsymposiumonmeasurementtechnologyandintelligentinstrument
AT takayayasuhiro internationalsymposiumonmeasurementtechnologyandintelligentinstrument
AT gaoyongsheng internationalsymposiumonmeasurementtechnologyandintelligentinstrument
AT krystekmichael internationalsymposiumonmeasurementtechnologyandintelligentinstrument

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