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International Symposium on Measurement Technology and Intelligent Instrument

Detalles Bibliográficos
Autores principales:	Gao, Wei, Takaya, Yasuhiro, Gao, Yongsheng, Krystek, Michael
Lenguaje:	eng
Publicado:	2008
Materias:	XX
Acceso en línea:	http://cds.cern.ch/record/1120456

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