Know the risk: learning from errors and accidents: safety and risk in today's technology

Detalles Bibliográficos
Autores principales: Duffey, Romney Beecher, Saull, John Walton
Lenguaje:eng
Publicado: Elsevier 2002
Materias:
Health Physics and Radiation Effects
Acceso en línea:http://cds.cern.ch/record/1137943

Internet

http://cds.cern.ch/record/1137943

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