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Evaluation of Two SiGe HBT Technologies for the ATLAS sLHC Upgrade

As previously reported, silicon-germanium (SiGe) heterojunction bipolar transistor (HBT) technologies promise several advantages over CMOS for the front-end readout electronics for the ATLAS upgrade. Since our last paper, we have evaluated the relative merits of the latest generations of IBM SiGe HB...

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Detalles Bibliográficos
Autor principal: Ullán, M
Lenguaje:eng
Publicado: CERN 2008
Materias:
Acceso en línea:https://dx.doi.org/10.5170/CERN-2008-008.111
http://cds.cern.ch/record/1158513
Descripción
Sumario:As previously reported, silicon-germanium (SiGe) heterojunction bipolar transistor (HBT) technologies promise several advantages over CMOS for the front-end readout electronics for the ATLAS upgrade. Since our last paper, we have evaluated the relative merits of the latest generations of IBM SiGe HBT BiCMOS technologies, the 8WL and 8HP platforms. These 130nm SiGe technologies show promise to operate at lower power than CMOS technologies and would provide a viable alternative for the Silicon Strip Detector and Liquid Argon Calorimeter upgrades, provided that the radiation tolerance studies at multiple gamma and neutron irradiation levels, included in this in