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Report no. 10: Comparison test between gate circuits of the firm "X" and CERN NP-type 2229
| Autor principal: | |
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| Lenguaje: | eng |
| Publicado: |
1967
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/1160531 |
| _version_ | 1780915876135960576 |
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| author | Righini, B |
| author_facet | Righini, B |
| author_sort | Righini, B |
| collection | CERN |
| id | cern-1160531 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1967 |
| record_format | invenio |
| spelling | cern-11605312019-09-30T06:29:59Zhttp://cds.cern.ch/record/1160531engRighini, BReport no. 10: Comparison test between gate circuits of the firm "X" and CERN NP-type 2229Detectors and Experimental TechniquesCERN-NP-Internal-Report-67-04oai:cds.cern.ch:11605311967-06-16 |
| spellingShingle | Detectors and Experimental Techniques Righini, B Report no. 10: Comparison test between gate circuits of the firm "X" and CERN NP-type 2229 |
| title | Report no. 10: Comparison test between gate circuits of the firm "X" and CERN NP-type 2229 |
| title_full | Report no. 10: Comparison test between gate circuits of the firm "X" and CERN NP-type 2229 |
| title_fullStr | Report no. 10: Comparison test between gate circuits of the firm "X" and CERN NP-type 2229 |
| title_full_unstemmed | Report no. 10: Comparison test between gate circuits of the firm "X" and CERN NP-type 2229 |
| title_short | Report no. 10: Comparison test between gate circuits of the firm "X" and CERN NP-type 2229 |
| title_sort | report no. 10: comparison test between gate circuits of the firm "x" and cern np-type 2229 |
| topic | Detectors and Experimental Techniques |
| url | http://cds.cern.ch/record/1160531 |
| work_keys_str_mv | AT righinib reportno10comparisontestbetweengatecircuitsofthefirmxandcernnptype2229 |