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NATO Advanced Research Workshop/International School of Materials Science and Technology - 2nd Workshop on Point, Extended and Surface Defects in Semiconductors
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Lenguaje: | eng |
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Springer
1988
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Acceso en línea: | https://dx.doi.org/10.1007/978-1-4684-5709-4 http://cds.cern.ch/record/116076 |