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Compiler-level Implementation of Single Event Upset Errors Mitigation Algorithms
Single Event Upset is a common source of failure in microprocessor-based systems working in environment with increased radiation level especially in places like accelerators and synchrotrons, where sophisticated digital devices operate closely to the radiation source. One of the possible solutions t...
| Autores principales: | , |
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| Formato: | info:eu-repo/semantics/article |
| Lenguaje: | eng |
| Publicado: |
2010
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/1237827 |