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Semi-automatic analysis of electron micrographs and diffraction patterns

Detalles Bibliográficos
Autores principales:	English, C Q, Titchmarsh, J M
Lenguaje:	eng
Publicado:	1980
Materias:	Detectors and Experimental Techniques
Acceso en línea:	http://cds.cern.ch/record/124213

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