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Comparison of Emittance Growth for 450 GeV Rigidity PB82+ ions and P+ in Thin Scatterers
The beam profile screens in the long SPS-to-LHC transfer lines were used to measure with high precision the emittance growth arising from scattering. The effective thickness of the scatterer could be varied by adding thick Al2O3 fluorescent screens, with the emittance measurement made using very thi...
| Autores principales: | , , |
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| Lenguaje: | eng |
| Publicado: |
2010
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/1277642 |