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3D Active Edge Silicon Detector Tests With 120 GeV Muons
3D detectors with electrodes penetrating through the silicon wafer and covering the edges were tested in the SPS beam line X5 at CERN in autumn 2003. Detector parameters including efficiency, signal-to-noise ratio, and edge sensitivity were measured using a silicon telescope as a reference system. T...
Autores principales: | , , , , , , , , , , , , , , , , , , , , , , , , , |
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Lenguaje: | eng |
Publicado: |
2009
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1109/TNS.2009.2013951 http://cds.cern.ch/record/1283926 |