3D Active Edge Silicon Detector Tests With 120 GeV Muons

3D detectors with electrodes penetrating through the silicon wafer and covering the edges were tested in the SPS beam line X5 at CERN in autumn 2003. Detector parameters including efficiency, signal-to-noise ratio, and edge sensitivity were measured using a silicon telescope as a reference system. T...

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Detalles Bibliográficos
Autores principales: Da Via, Cinzia, Deile, Mario, Hasi, Jasmine, Kenney, Christopher, Kok, Angela, Parker, Sherwood, Watts, Stephen, Anelli, Giovanni, Avati, Valentina, Bassetti, Valerio, Boccone, Vittorio, Bozzo, Marco, Eggert, Karsten, Ferro, Fabrizio, Inyakin, Alexandre, Kaplon, Jan, Lozano Bahilo, Julio, Morelli, Aldo, Niewiadomski, Hubert, Noschis, Elias, Oljemark, Fredrik, Oriunno, Marco, Österberg, Kenneth, Ruggiero, Gennaro, Snoeys, Walter, Tapprogge, Stefan
Lenguaje:eng
Publicado: 2009
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1109/TNS.2009.2013951
http://cds.cern.ch/record/1283926

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