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Thin Film Analysis by X-Ray Scattering: Techniques for Structural Characterization

With contributions by Paul F. Fewster and Christoph Genzel. While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of t...

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Detalles Bibliográficos
Autor principal: Birkholz, Mario
Lenguaje:eng
Publicado: Wiley-VCH 2005
Materias:
Acceso en línea:http://cds.cern.ch/record/1320653