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Thin Film Analysis by X-Ray Scattering: Techniques for Structural Characterization
With contributions by Paul F. Fewster and Christoph Genzel. While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of t...
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| Lenguaje: | eng |
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Wiley-VCH
2005
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| Acceso en línea: | http://cds.cern.ch/record/1320653 |