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Characterisation of a Pixel Sensor in 0.20 micron SOI Technology for Charged Particle Tracking

This paper presents the results of the characterisation of a pixel sensor manufactured in OKI 0.2 micron SOI technology integrated on a high-resistivity substrate, and featuring several pixel cell layouts for charge collection optimisation. The sensor is tested with short IR laser pulses, X-rays and...

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Detalles Bibliográficos
Autores principales:	Battaglia, Marco, Bisello, Dario, Contarato, Devis, Denes, Peter, Giubilato, Piero, Mattiazzo, Serena, Pantano, Devis, Zalusky, Sarah
Lenguaje:	eng
Publicado:	2011
Materias:	Detectors and Experimental Techniques
Acceso en línea:	https://dx.doi.org/10.1016/j.nima.2011.05.081 http://cds.cern.ch/record/1334083

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