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NATO Advanced Study Institute on Scanning Probe Microscopy : Characterization, Nanofabrication and Device Application of Functional Materials
As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in...
| Autores principales: | , , |
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| Lenguaje: | eng |
| Publicado: |
Kluwer Academic Publishers
2005
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| Acceso en línea: | https://dx.doi.org/10.1007/1-4020-3019-3 http://cds.cern.ch/record/1339262 |