Cargando…
Design and characterization of an SEU-robust register in 130nm CMOS for application in HEP ASICs
| Autor principal: | |
|---|---|
| Publicado: |
2010
|
| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1088/1748-0221/5/11/C11019 http://cds.cern.ch/record/1352697 |