Design and characterization of an SEU-robust register in 130nm CMOS for application in HEP ASICs

Detalles Bibliográficos
Autor principal: Bonacini, S
Publicado: 2010
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1088/1748-0221/5/11/C11019
http://cds.cern.ch/record/1352697
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author Bonacini, S
author_facet Bonacini, S
author_sort Bonacini, S
collection CERN
id cern-1352697
institution Organización Europea para la Investigación Nuclear
publishDate 2010
record_format invenio
spelling cern-13526972019-09-30T06:29:59Zdoi:10.1088/1748-0221/5/11/C11019http://cds.cern.ch/record/1352697Bonacini, SDesign and characterization of an SEU-robust register in 130nm CMOS for application in HEP ASICsDetectors and Experimental Techniquesoai:cds.cern.ch:13526972010
spellingShingle Detectors and Experimental Techniques
Bonacini, S
Design and characterization of an SEU-robust register in 130nm CMOS for application in HEP ASICs
title Design and characterization of an SEU-robust register in 130nm CMOS for application in HEP ASICs
title_full Design and characterization of an SEU-robust register in 130nm CMOS for application in HEP ASICs
title_fullStr Design and characterization of an SEU-robust register in 130nm CMOS for application in HEP ASICs
title_full_unstemmed Design and characterization of an SEU-robust register in 130nm CMOS for application in HEP ASICs
title_short Design and characterization of an SEU-robust register in 130nm CMOS for application in HEP ASICs
title_sort design and characterization of an seu-robust register in 130nm cmos for application in hep asics
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1088/1748-0221/5/11/C11019
http://cds.cern.ch/record/1352697
work_keys_str_mv AT bonacinis designandcharacterizationofanseurobustregisterin130nmcmosforapplicationinhepasics

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