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Design and characterization of an SEU-robust register in 130nm CMOS for application in HEP ASICs

Detalles Bibliográficos
Autor principal:	Bonacini, S
Publicado:	2010
Materias:	Detectors and Experimental Techniques
Acceso en línea:	https://dx.doi.org/10.1088/1748-0221/5/11/C11019 http://cds.cern.ch/record/1352697

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