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Impact of NBTI Aging on the Single-Event Upset of SRAM Cells
We analyzed the impact of negative bias temperature instability (NBTI) on the single-event upset rate of SRAM cells through experiments and SPICE simulations. We performed critical charge simulations introducing different degradation patterns in the cells, in three technology nodes, from 180 to 90 n...
| Autores principales: | , , , , |
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| Lenguaje: | eng |
| Publicado: |
2010
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1109/TNS.2010.2084100 http://cds.cern.ch/record/1359267 |